ISSN:
1573-482X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The dielectric properties of diamond thin films obtained on silicon substrates by microwave plasma-assisted chemical vapour deposition (MWCVD) have been measured in the frequency range from 0.1 to 103 kHz at different temperatures up to 150
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00188958
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