Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
80 (2002), S. 2404-2406
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We report on the formation of submicrometer voids within a doped polymethylmethacrylate (PMMA) polymer under multiphoton absorption excited by an infrared laser beam. An ultrashort pulsed laser beam of pulse width 80 fs at a repetition rate of 82 MHz and a wavelength of 800 nm is focused into a PMMA-based photorefractive polymer consisting of 2,5-dimethyl-4(p-nitrophenylazo)anisole, 2,4,7-trinitro-9-fluorenone, and N-ethylcarbazole. The large change in refractive index associated with a void allows confocal reflection microscopy to be used as a detection method. Voids can be arranged in a multilayered structure for read-only high-density optical data storage. © 2002 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1467615
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