ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The design and implementation of a low temperature (T≥1.5 K), near-field scanning optical microscope are described herein. This microscope, which is based on the recently developed tapered fiber probe, is optimized for luminescence imaging and spectroscopy of mesoscopic semiconductor systems.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145128
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