Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
68 (1997), S. 4549-4554
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The setup of an electron spectrometer for angle-resolved photoemission is described. A sample goniometer offers the opportunity for angle scanned photoemission over 2π solid angle above the surface. A monochromatized high flux He discharge photon source is exploited to measure thermally populated electronic states above the Fermi level EF. At energies greater than EF+5kBT the signal from a constant density of states declines below the photoelectron background caused by photons with higher energies than He Iα (21.2 eV). For He IIα (40.8 eV) the residual photoelectron background is lower and photoemission up to 6kBT above EF can be performed. Data showing two cuts through the Fermi surface of silver are presented. Furthermore the dispersion of the Shockley surface state on Ag (111) above the Fermi energy is quantified. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1148429
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