ISSN:
0142-2421
Keywords:
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
XPS when used in conjunction with silylation can determine surface hydroxide. The penetration depth was studied using DRIFT and various silylation conditions. Application of this technique to many different inorganic matrices, including Si3N4, glass, silica thin film, zinc silicate lamp phosphor and Al2O3, is illustrated.
Additional Material:
5 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/sia.740180214
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