Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
72 (1998), S. 2779-2781
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We report a near-field scanning optical microscope using a solid immersion lens having a sharp tip that is mounted to a cantilever. The sharp tip allows the sample to enter the near field of the illumination. The cantilever provides sensitive control of forces. We describe two types of near-field optical contrast, interference and reflection, that simultaneously measure surface topography and reflectivity. Using a super-hemispherical lens with index n=2.2 and 442 nm illumination, the microscope resolves optical features smaller than 150 nm, a factor of 2 improvement over a conventional optical microscope. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.121457
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