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  • 1
    Monograph available for loan
    Monograph available for loan
    Baltimore [u.a.] : Johns Hopkins Univ. Press
    Call number: 19/M 97.0071
    Type of Medium: Monograph available for loan
    Pages: xxvii, 694 S.
    Edition: 3rd ed.
    ISBN: 0801854148
    Series Statement: John Hopkins studies in the mathematical sciences
    Classification:
    C.1.8.
    Language: English
    Location: Reading room
    Branch Library: GFZ Library
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 1317-1320 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Several methods of measuring contact resistivity between silver electrodes and YBa2Cu3O7−x superconductors were investigated; i.e., two-point, three-point, and lap-joint methods. The lap-joint method was found to yield the most consistent and reliable results and is proposed as a new technique for this measurement. Painting, embedding, and melting methods were used to apply the electrodes to the superconductor. Silver electrodes produced good ohmic contacts to YBa2Cu3O7−x superconductors with contact resistivities as low as 1.9×10−9 Ω cm2.
    Type of Medium: Electronic Resource
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  • 3
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Inorganic chemistry 33 (1994), S. 1948-1952 
    ISSN: 1520-510X
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 75 (1994), S. 4085-4091 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Axisymmetric three-point measurement of the contact resistance between a metal electrode and a superconductor substrate shows significant variation as a function of the placement of the voltage measuring probe on the metal electrode. This study explored this variation by the use of an analytical model simulating the voltage variation in the metal electrode. The model used a simplified scheme of mapping the electrode-superconductor interface to an equivalent layer with the same resistivity as the metal electrode. The voltage in the electrode was obtained by solving Laplace's equation. Using a numerical approximation process, three simplified equations for calculating the contact resistivities from the voltage measured from the three-point method were developed. The contact resistivities calculated from the modified equations and those measured from the lap-joint method were compared in order to show the validity of the modified equations. The radii of the electrode and current leads, and the ratio of the voltage measured at the top edge of the electrode to the voltage measured at the current lead determine the selection of the modified equations.
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 9-15 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electro-optic properties of thin-film materials grown on opaque substrates are determined utilizing the principles of reflection differential ellipsometry. The scheme of the measurement involves the detection of the field-induced phase shift in a probing light beam reflected from thin-film samples. To quantitatively determine the field-induced indices change or birefringence and the field-induced strain it is essential to model the differential ellipsometric process in the stratified structure. The modeling reveals that the field-induced changes of the ordinary and the extraordinary indices contribute to the measured phase shift with different incident-angle dependences. The field-induced strain gives yet another unique incident-angle distribution. By means of an incident-angle-varying technique, therefore, the field-induced changes of ordinary index and extraordinary index in a thin-film material may be determined separately. Detailed descriptions of the measuring technique and the modeling work are presented. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 56 (1985), S. 1612-1618 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A microwave interferometer system which provides a continuous measurement of the position of interfaces, such as shock fronts, detonation fronts, or material surfaces, has been developed. The use of low-mass microcoaxial cable, some of which is commercially available, and stripline for conducting the microwave signal into the interior of an experiment makes the perturbation of the measuring system on the experiment small. Other microwave systems have measured the time of peak amplitude of a reflected signal, but the present system with proper matching produces a continuous record of position as a function of time. It is believed that this technique can be used to replace most uses of electrical contact or fiber-optic pins in high-explosive experiments. The amount of data far exceeds that which it is possible to obtain from pins or optical fibers. The matching of the microcoax to the microwave generator has an important effect on the accuracy of the technique. The effect of matching on accuracy will be described in detail, and matching methods will be discussed. A position accuracy of 0.2 mm has been attained. Several methods for extracting position information as a function of time are possible. These techniques are discussed, and their application to the analysis of an experiment is demonstrated. The data from the interferometer system is compared to a streak camera record in a phased, shock-breakout experiment. Agreement is quite good, and the superiority of this method over the pin method is demonstrated by comparing details of the streak and interferometer records.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Oxford, Uk and Boston, USA : Blackwell Publishers Ltd
    Pacific economic review 5 (2000), S. 0 
    ISSN: 1468-0106
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Economics
    Notes: The paper studies the effect of tariff reduction on employment in China. Using a computable general equilibrium (CGE) analysis, a model simulates the structural adjustment in the Chinese economy as a result of tariff cuts and predicts their quantitative impacts on structural unemployment during the adjustment period. It is concluded that the structural unemployment in China caused by tariff reduction is not as serious as some have claimed. The technique of study on structural unemployment can be extended to other countries to analyze the impact of trade reform.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 65 (1994), S. 2507-2509 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A photoactivated birefringence has been observed in an antiferroelectric lead zirconate titanate (PZT) thin film material bounded by an indium-tin oxide (ITO) electrode. This phenomenon stemmed from the ultraviolet (UV) assistance to an antiferroelectric-to-ferroelectric structural transition which otherwise was inhibited by an effect of the lead zirconate titanate (PZT)-ITO interface. The UV-assisted structural transition was accompanied by a significant change in the birefringence of the PZT thin films. Using this phenomenon, an UV-addressed visible-light modulation was demonstrated with an ITO/PZT/Pt thin film structure on silicon substrates. © 1994 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 1730-1732 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a birefringent bistability exhibited in ferroelectric thin films with a ferroelectric-semiconductor interface. Such birefringent bistability is observed in (Pb,La)(Zr,Ti)O3 (PLZT) thin films which are sandwiched between a platinum and a semiconducting indium-tin oxide (ITO) electrode. The magnitude of the birefringence between the two remanent states is approximately 0.9×10−3. The Pt/PLZT/ITO structure features a nonvolatile electro-optic memory operation, i.e., the switching between the two remanent birefringent states with bipolar electric pulses.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 1050-1052 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Lead lanthanum zirconium titanate (PLZT) 9.5/65/35 samples were electroded with BSCCO and YBCO superconductor materials. Extensive interaction was obtained between the PLZT and the YBCO, and very low interaction was observed between the BSCCO and the PLZT. The BSCCO superconductor on the PLZT substrate maintained its superconducting properties at liquid nitrogen temperature. The apparent dielectric constant of the PLZT was influenced by the electroding materials. Domain switching was found to be influenced by the electrode materials at low temperature. The BSCCO electroded samples showed the highest polarization switching rate among the samples electroded by different materials.
    Type of Medium: Electronic Resource
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