ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The operating conditions required to obtain scanning-electron-beam anomalous transmission (SEBAT) patterns were investigated and the factors likely to limit the range of materials to which the technique may be applied were studied. It was found that the SEBAT technique is less restricted than is transmission electron microscopy. SEBAT patterns were obtained on a Geoscan X-ray microanalyser from samples of Si, Ge, Ag, CdS, NaCl, epitaxial Si on sapphire, mineralogical mica, and galena. The geometry of SEBAT patterns is discussed and it is emphasised that they are not Kikuchi patterns despite the very close resemblance.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00549740
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