Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Journal of Applied Physics
88 (2000), S. 4146-4152
ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Stainless steel wires under tensile stress displayed narrow band peaks in the low frequency region of the power spectrum that were ∼104 times the background Johnson noise. The electrical response to stress was analyzed in terms of the root mean squared (rms) voltage (Vrms) of the noise signal over a 13 Hz bandwidth. The information obtained from such measurements is independent of other nondestructive testing methods and is therefore a useful probe of the stress-strain dynamics in metals and alloys. The rms voltage initially increases exponentially with the applied stress but subsequently decreases near the point of failure. This voltage is also approximately proportional to the square root of the sample resistance (Rs1/2). It is proposed that this noise signal is due to the fluctuations in the piezoresistivity as a result of stress induced reorientation of defects, similar to the Zener relaxation of solute atoms in a solid solution. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1310184
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