ISSN:
0142-2421
Keywords:
SIMS
;
LEIS
;
secondary ion mass spectrometry
;
low-energy ion scattering
;
Chemistry
;
Polymer and Materials Science
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
Kinetic energy distributions of the secondary ions and scattered ions of O+, Cs+ and Ar+ (bombardment with primary ions of O-, O2+, Cs+ and Ar+ was utilized) were obtained from the elemental surfaces of Mg, Al, Si, Ag and Pb using a modified Cameca IMS-3f magnetic sector mass spectrometer. In addition, the distributions of O+ were acquired for O2+ ion surface bombardment of several standard reference materials (Ti-base alloys of SRM648 and SRM649) and geological samples [pyrrhotite (Fe(1-x)S) and arsenopyrite (FeAsS)]. Distinct features attributable to elastic binary projectile/target backscattering collisions were found to be superimposed in the data. Hence, a full characterization of these kinetic ion energy distributions could be made. As a result it is possible to identify both the secondary ion and scattered ion contributions present in the collected kinetic energy distributions and to perform low-energy primary ion surface scattering (LEIS) experiments combined with in situ secondary ion mass spectrometry (SIMS) analysis, albeit to a reduced sensitivity and resolution compared to those possible on dedicated LEIS instruments. © 1998 John Wiley & Sons, Ltd.
Additional Material:
7 Ill.
Type of Medium:
Electronic Resource
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