Publication Date:
2011-05-12
Description:
Author(s): Felix Hoehne, Jinming Lu, Andre R. Stegner, Martin Stutzmann, Martin S. Brandt, Martin Rohrmüller, Wolf Gero Schmidt, and Uwe Gerstmann We show that the electrical detection of electron-spin-echo envelope modulation (ESEEM) is a highly sensitive tool to study interfaces. Taking the Si/SiO_{2} interface defects in phosphorus-doped crystalline silicon as an example, we find that the main features of the observed echo modulation patter... [Phys. Rev. Lett. 106, 196101] Published Wed May 11, 2011
Keywords:
Condensed Matter: Structure, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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