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  • 1
    Electronic Resource
    Electronic Resource
    Preparation and structural characterization of epitaxial Co/Pd(111) superlattices : 35th annual conference on magnetism and magnetic materials (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 5310-5312 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-quality epitaxial fcc Co/Pd(111) superlattices have been prepared on single-crystal GaAs(110) substrates using molecular-beam epitaxy. An ultrathin (6 A(ring)) buffer layer of bcc Co(110) was used to promote epitaxial growth on the GaAs substrate. A thick (≈ 500 A(ring)) buffer layer of fcc Pd(111) was then deposited to provide a smooth surface for superlattice growth. In addition, the Pd buffer layer isolates the superlattice from chemical interaction with the GaAs substrate. Co/Pd superlattices with ultrathin (〈20 A(ring)) Co layers are found to have a perpendicular easy axis of magnetization. The source of the perpendicular magnetization in these superlattices is attributed to an interface anisotropy, which depends on the interface quality and crystal structure. The structure of the superlattices has been investigated using a wide range of techniques, including reflection high- energy electron diffraction, low-energy electron diffraction, scanning tunneling microscopy, Rutherford backscattering spectroscopy, and a variety of x-ray-diffraction techniques. Details of the structure, including grain size, coherence length, and interfacial roughness are discussed. The magnetic properties of these superlattices are presented elsewhere in these proceedings.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.348059
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  • 2
    Electronic Resource
    Electronic Resource
    Structural and magnetic properties of Ti/Co multilayers (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 67 (1990), S. 4910-4912 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have investigated the structural and magnetic properties of sputter-deposited Ti/Co multilayer thin films. Sample composition was determined by Rutherford backscattering spectrometry. The crystal structure and composition modulation were examined with several x-ray diffraction techniques. X-ray diffraction analysis showed that the Ti and Co layers grow in the hcp structure and that the films are strongly textured along the (002) direction and are structurally incoherent. Composition modulation was confirmed from low-angle x-ray diffraction measurements. Vibrating-sample magnetometry (VSM) and Brillouin light scattering (BLS) were used to determine the magnetic properties of the films. VSM measurements of samples with Co layer thicknesses less than ≈22 A(ring) showed no measurable net magnetization, while those with greater Co layer thicknesses had both in-plane and perpendicular components. Using a simple model, the measured thickness dependence of the magnetization can be explained by assuming that 11.3 A(ring) of Co at each Ti interface is nonmagnetic with bulk magnetization for the remaining Co. Perpendicular volume and interface anisotropy constants obtained from the VSM data were Ks=0.23 erg/cm2 and Kv=3.5×106 erg/cm3, respectively. Excellent agreement was obtained between the best fit magnetic parameters for the VSM and the BLS data.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.344728
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  • 3
    Electronic Resource
    Electronic Resource
    Magnetic properties of Co/Pd multilayers determined by Brillouin light scattering and SQUID magnetometry (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 2448-2454 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Co/Pd multilayers with modulation wavelengths between 4 and 220 A(ring) have been prepared by magnetically enhanced dc-triode sputtering on single-crystal sapphire substrates. Their saturation magnetization and volume and interface anisotropies have been investigated using Brillouin light scattering from collective spin waves and by SQUID magnetometry. The saturation magnetization of Co is found to be independent of the Co layer thickness and reduced by about 20% from the Co bulk value. From the comparison of the results of the two experimental methods, clear evidence for a Pd polarization is found and the polarization depth is estimated. Samples with Co thicknesses of 2 atomic layers and Pd thicknesses ≥5 atomic layers exhibit a perpendicular magnetization due to a large negative out-of-plane interface anisotropy. The properties of spin waves in Co/Pd multilayers with the direction of magnetization pointing out-of-plane are discussed with respect to an appropriate theoretical model.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.348681
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  • 4
    Electronic Resource
    Electronic Resource
    Effect of transition-metal overlayers on the perpendicular magnetism of MBE-grown, ultra-thin Co films : 37th Annual conference on magnetism and magnetic materials (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 6192-6194 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used in situ polar Kerr ellipticity measurements to study the perpendicular magnetic behavior of MBE-grown Pd/Co/TM sandwich structures, where TM is the nonmagnetic transition metal overlayer Pd, Cu, or Ag. These structures are epitaxially deposited on thick Pd (111) buffer layers grown on Co-seeded GaAs (110) substrates. Hysteresis curves were measured in situ for systematically varied Co and TM layer thicknesses 2 A(ring)≤tCo≤10 A(ring) and 0 A(ring)≤tTM≤200 A(ring). We observed perpendicular loops with a coercive field of Hc≤200 Oe for the uncovered Co films for tCo≤6 A(ring), becoming in-plane above this thickness. However, subsequent deposition of just one atomic layer (≈2 A(ring)) of any of the TM over the Co resulted in strongly perpendicular, square hysteresis curves with Hc≥700 Oe for all films in the Co thickness range studied. Deposition of TM overlayers causes nonmonotonic behavior in Hc as a function of coverage. We find a peak in Hc at a TM coverage of tTM∼1.5 A(ring) for all materials, with a subsequent monotonic increase above tTM≈4 A(ring) to a limiting value by tTM≈100 A(ring). The peak is most pronounced for Cu, where Hc changes by more than 200%.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.352694
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  • 5
    Electronic Resource
    Electronic Resource
    Magnetocrystalline and magnetoelastic anisotropy in epitaxial Co/Pd superlattices : The 5th Joint MMM−Intermag Conference (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 5873-5875 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have used molecular-beam epitaxy (MBE) to grow Co/Pd superlattices along the three high-symmetry crystal axes: [001], [110], and [111]. Identical conditions were maintained for all depositions, and a series of samples of fixed Pd thickness (tPd = 10 ± 1 A(ring)) and varying Co thickness (2 A(ring) ≤ tCo ≤ 22 A(ring)) were prepared for each orientation. A variety of in situ and ex situ characterization studies were made, which confirm these superlattices are single crystalline for all growth directions. The dependence of the uniaxial magnetic anisotropy energy on the Co thickness in these superlattices showed significant systematic differences for each of the three crystal orientations. These variations result entirely from differences in the volume contribution to the anisotropy. Estimates of the magnetocrystalline and magnetoelastic contributions for the (111) and (001) samples are in good agreement with the measured anisotropy energies of these oriented superlattices.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.350113
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  • 6
    Electronic Resource
    Electronic Resource
    Magnetic properties of epitaxial Co/Pd superlattices : 35th annual conference on magentism and magnetic materials (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 5643-5645 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of Co/Pd superlattices with constant Pd layer thickness of dPd = 11 A(ring) were grown on single-crystal GaAs(110) substrates by molecular beam epitaxy (MBE). A buffer layer of 500 A(ring) of Pd provided an atomically smooth, fcc(111) single-crystal starting surface for the superlattice deposition. The resulting superlattices maintain this crystal symmetry and smoothness throughout their epitaxial growth. Details of the structural characterization of these samples are given elsewhere in these proceedings. The magnetic properties of these films have been measured by vibrating sample magnetometry. A perpendicular easy axis is found for all seven of the superlattices presented (dCo = 2, 4, 8, 10, 12, 17, and 20 A(ring)). An unusually high coercive field of Hc = 6.6 kOe is observed for dCo = 2 A(ring), and decreases monotonically with increasing dCo. The saturation magnetization agrees well with a model composed of bulk Co layers with an additional contribution from polarized Pd. The uniaxial magnetic anisotropy energy can be described by both an interface term and a large volume term favoring a perpendicular easy axis for dCo 〈 23 A(ring). Comparisons with a series of polycrystalline multilayers simultaneously deposited on Si substrates reveal significant differences in the magnetic behavior.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.347922
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  • 7
    Electronic Resource
    Electronic Resource
    Effects of misfit strain due to epitaxial growth on interface perpendicular magnetic anisotropy in ultrathin Co/Au/Cu(111) films (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 6107-6109 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We observe a systematic increase in interface perpendicular magnetic anisotropy (PMA) with increasing Au-interlayer thickness tAu ranging from 1 to 5 monolayers (MLs) in Cu/Co/Au/Cu(111), where misfit strain in Co due to the epitaxial growth increases with increasing tAu. This result can be understood within the framework of the magneto-elastic contribution to the interface PMA. With a Cu overlayer, a constant contribution of interface PMA as well as of volume anisotropy is observed when the Co thicknesses are greater than 1.3 ML. However, we have found an unexpected suppression of this variation of interface PMA with the use of Au overlayers instead of Cu ones. With Au or Pd overlayers, the PMA starts to degrade as the Co thickness is reduced below 2.5 ML. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.372624
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  • 8
    Electronic Resource
    Electronic Resource
    Specular and diffuse electron scattering at interfaces in metal spin-valve structures (1999)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 86 (1999), S. 476-479 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We have made thickness dependent in situ resistivity measurements on sputtered metal films in real time during film deposition. These measurements allow the separation of the bulk and finite-size contributions to the resistance. The metals studied were Co, Cu, Ni80Fe20, and Ta, deposited in differing orders to isolate the scattering at interfaces relevant to common spin-valve structures. We see sources of excess diffuse scattering in bilayers of Ta with the 3d metals, regardless of the deposition order. We see a similar effect for Co on Cu, but not for Cu on Co. In some cases, we see significant changes in film resistance from overlayers as thin as 2 Å. These results show that the two Cu interfaces in a spin valve are not equivalent, and that other interfaces in the structure may be important. We discuss the origin of the diffuse scattering in terms of interdiffusion or a roughening transition during the initial deposition and island coalescence. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.370755
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  • 9
    Electronic Resource
    Electronic Resource
    Structure and performance of Si/Mo multilayer mirrors for the extreme ultraviolet (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 2144-2156 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report the results of structural, chemical, and extreme ultraviolet (EUV) characterization of Si/Mo multilayers grown by sputtering and by UHV evaporation. This study includes mirrors designed for normal incidence with peak reflectivities Rpeak between 22 and 24 nm, and 45° mirrors having Rpeak between 16 and 19 nm. The deposition conditions were varied to produce multilayers with a wide range of interface morphologies. A variety of techniques were used to determine the structure and composition of the multilayers, including x-ray diffraction, transmission electron microscopy, Rutherford backscattering spectroscopy, and Auger depth profiling. All of the mirrors have amorphous Si layers and polycrystalline Mo layers with thin amorphous alloy interlayers. We obtain good fits to the low-angle x-ray diffraction data only when these interlayers are taken into account. The best sputter-deposited mirrors were made at the lowest Ar pressure studied, 3 mTorr. The best evaporated mirrors were produced at a substrate temperature of 200 °C. The EUV reflectivity as a function of wavelength was measured using synchrotron radiation. Both the multilayer structure and surface contamination significantly affect the EUV reflectivity, and must be considered to obtain good fits to the reflectivity curves. The best 45° mirror had a peak reflectivity of 53% at 18.6 nm for 100% S-polarized light, and the best normal-incidence mirror had a peak reflectivity of 33% at 23.6 nm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357626
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  • 10
    Electronic Resource
    Electronic Resource
    Magnetic anisotropy of metal/Co/metal and metal/Co/insulator sandwiches : The 6th joint magnetism and magnetic materials (MMM)-intermag conference (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 6075-6077 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In situ polar Kerr-effect measurements have been used to study the magnetic anisotropy of MBE-grown Au(111)/Co/X and Pd(111)/Co/X sandwiches, where X is the nonmagnetic metal Ag, Au, Cu, and Pd or the insulator MgO. For the metals it was recently found that the magnitude of the Co/X perpendicular interface anisotropy is strongly peaked at ∼1 atomic layer (1.5–2.5 A(ring)) coverage. To investigate structural influences on the anisotropy, reflection high-energy electron diffraction (RHEED) and low-energy electron diffraction (LEED) have been used to measure changes resulting from overlayer coverage. Analysis of digitized RHEED images captured every ∼1 A(ring) during metal overlayer coverage shows no abrupt change of the in-plane lattice constant. The out-of-plane lattice spacing has also been investigated as a function of nonmagnetic metal coverage by measuring LEED I-V curves along the (0,0) rod. In the case of Cu, where the LEED behavior is nearly kinematic, no evidence was seen of any abrupt structural changes at ∼1 atomic layer coverage. These results suggest the observed peak in magnetic anisotropy is not structural in origin. To further study this phenomenon, the influence of an insulating overlayer, MgO, on the perpendicular magnetic properties has been measured.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358478
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