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  • 1
    Monograph available for loan
    Monograph available for loan
    Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie (1986)
    Berlin [u.a.] : Springer
    Details Availability
    Call number: 13896
    Type of Medium: Monograph available for loan
    Pages: VIII, 300 S. : Ill., graph. Darst.
    ISBN: 3540150501
    Location: Upper compact magazine
    Branch Library: GFZ Library
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  • 2
    Electronic Resource
    Electronic Resource
    Quantitative surface analysis by X-ray photoelectron spectroscopy and X-ray excited auger electron spectroscopy (1990)
    Springer
    Microchimica acta 101 (1990), S. 49-54 
    Details
    ISSN: 1436-5073
    Keywords: quantitative surface analysis ; X-ray photoelectron spectroscopy ; X-ray excited Auger electron spectroscopy ; analysis without reference samples
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract It is shown that X-ray excited KLL Auger electron spectra allow it to describe measured signal strengths similarly to X-ray photoelectron signals, thus offering valuable information on the quantitative surface composition of a solid sample. The principal equation and corresponding fundamental parameters are discussed. As a result Auger spectra of C, N, O, F, and Na can be easily used in a multiline approach for quantitative analysis. LMM and MNN spectra give rise to more problems, due to their more complicated structure, uncertainties with regard to the background and the influence of Coster-Kronig transitions. These problems are overcome by the use of empirical ratios of the strongest lines of 2p/LMM or 3d/MNN. Since these ratios are independent of sample composition, they allow it to transform the Auger signal into the corresponding photoelectron signal, provided that a standard sample has been measured. Thus a true additional information is obtained and moreover difficulties in cases of photoelectron spectra with overlapping lines from other chemical elements can be overcome.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01244157
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  • 3
    Electronic Resource
    Electronic Resource
    Quantitative surface analysis performed with an imaging photoelectron spectrometer (1990)
    Springer
    Microchimica acta 101 (1990), S. 63-69 
    Details
    ISSN: 1436-5073
    Keywords: imaging photoelectron spectrometry ; small spot analysis ; pixel analysis ; selected area analysis ; quantitative surface analysis ; overlayer thickness
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The paper gives an outline of the basic principle of our imaging technique for XPS. The advantage of the concept is its excellent applicability to quantitative pixel information. This idea is verified by two examples which are representative for routine problems in XPS. These are quantitative surface analysis and determination of overlayer thicknesses. A lateral resolution of at least 0.2 mm is achieved and thus a pixel size of 0.2 mm × 0.2 mm can be quantified automatically by means of numerical algorithms without need of reference samples.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01244159
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  • 4
    Electronic Resource
    Electronic Resource
    Experimental evidence for the surface change of solid state copper ion-selective electrodes in chloride medium (1987)
    Springer
    Microchimica acta 92 (1987), S. 177-186 
    Details
    ISSN: 1436-5073
    Keywords: ion-selective electrodes ; Cu-electrode ; Cl− effect on Cu-elec-trode ; surface studies with ISEs
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract The surface changes and potentiometric response of three copper ion-selective membranes (CuS precipitate-based, CuS/Ag2S precipitate based and CuS mineral (covellite)-based) were studied after pretreatment in chloride ion containing solutions. The composition change of the membranes was identified by X-ray photoelectron spectroscopy (XPS). A correlation between surface change and response function was proved.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01201837
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  • 5
    Electronic Resource
    Electronic Resource
    Surface analysis by TEY — Theory and applications (1997)
    Springer
    Microchimica acta 125 (1997), S. 165-171 
    Details
    ISSN: 1436-5073
    Keywords: nondispersive electron spectroscopy ; surface analysis ; total electron yield (TEY) ; partial electron yield (PEY)
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract TEY (total electron yield) is frequently used to investigate EXAFS and XANES in the region of low photon energies and high photoabsorption coefficients. We extended the application to quantitative surface analysis [1,2]. For this purpose we developed by analogy to the theoretical approaches of quantitative X-ray fluorescence analysis a correlation between measured TEY-jumps at specific absorption edges of the specimen and the unknown composition. The present paper describes the derivation of the equations for primary and secondary excited contributions to the measured TEY-jumps. We have checked our theory for the example of binary Au-Pd alloys. Besides, the influence of a retarding field between the specimen surface and the electron detector on the analytical results is outlined.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01246181
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  • 6
    Electronic Resource
    Electronic Resource
    Quantitative Röntgenfluorescenzanalyse an Proben mit allgemeiner Oberfläche (1973)
    Springer
    Fresenius' Zeitschrift für analytische Chemie 264 (1973), S. 361-364 
    Details
    ISSN: 1618-2650
    Keywords: Röntgenfluorescenz-Spektrometrie ; Einfluß der Oberflächenrauhigkeit auf die Fluorescenzzählrate
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Zusammenfassung Es wird der Einfluß der Oberflächenrauhigkeit auf die Fluorescenzzählrate mit Hilfe eines statistischen Modells behandelt.
    Notes: Abstract The influence of surface roughness on the fluorescent count rate is described by the use of a statistical model.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00423633
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  • 7
    Electronic Resource
    Electronic Resource
    Probing the influence of thin overlayers on the results of quantitative XPS analysis without reference samples (1980)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 2 (1980), S. 173-178 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: In contrast to physical methods with large information depths, the results of quantitative XPS analysis are strongly influenced by oxide and/or contamination overlayers with a thickness of 1-2 monolayers. A new method is introduced which allows the determination of a value d/(Λref cos ε)without the application of the variable take-off angle technique. The significance of the results and their associated errors are discussed.
    Additional Material: 7 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740020504
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  • 8
    Electronic Resource
    Electronic Resource
    Evaluating ratio data for the determination of reduced thicknesses by XPS (1981)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 3 (1981), S. 149-152 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: XPS investigations of surfaces with overlayers of thicknesses smaller than 10 nm provide photoelectron spectra from the substrate and the overlayer. For determination of the reduced thickness of the layer it is most valuable to employ a ratio of integrated line intensities (nlayer/nsubstrate). The theory of the ratio method results in a ‘two unknowns’ problem (reduced thickness and a constant). For SiO2 on Si the constant is well known (0.67) and thus the thickness of the layer can be obtained by a measurement performed under one take-off angle. Other experimental situations demand measurements under different take-off angles and a least-squares fit. It is shown how surface roughness influences the application of equations derived for ideally smooth surfaces. The use of these equations for photoelectrons with great differences in their energies is demonstrated.
    Additional Material: 3 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740030402
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  • 9
    Electronic Resource
    Electronic Resource
    The significance of reduced thicknesses determined by XPS using the variable take-off angle technique (1981)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 3 (1981), S. 173-175 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The results of quantitative XPS analysis show a systematic change when the sample surface is covered by an overlayer. An accurate knowledge of the reduced thickness (x) of the total overlayer (e.g. oxide plus contamination) allows the quantification of such changes. The total reduced thickness (x) can be determined from the photoelectron signals of the substrate measured for different take-off angles. It is found that this method can be applied for reduced thicknesses up to x = 3 with an error Δx estimated at less than 10%.
    Additional Material: 2 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740030407
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  • 10
    Electronic Resource
    Electronic Resource
    Growth of a contamination layer (1981)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 3 (1981), S. 146-147 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: The energy dependence of the mean free path of electrons in a solid material can be used for a simple determination of the reduced thickness of a contamination layer without application of the variation of the electron take-off angle. Moreover, it allows the observation of the growth of a contamination layer as well as the determination of the reduced thickness of the contaminations on other specimens in the sample chamber under the same experimental conditions.
    Additional Material: 1 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740030309
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