Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
67 (1995), S. 3138-3140
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
(111)A CdTe epilayers have been grown directly on (111) silicon substrates with the low growth rate of less than 0.5 μm/h by metalorganic chemical vapor deposition (MOCVD). The full width at half maximum (FWHM) of the x-ray rocking curve of a 1 μm thick epilayer is 100 arcsec, which is much better than the value for (111)B CdTe/(100)Si. The low growth rate effects are deduced from the classical capillarity theory. The nucleation stages were examined by atomic force microscopy (AFM), which showed that the nuclei were less in number when growing with the low growth rate. The geometrical advantages of (111)A CdTe/(111) Si for annihilating the dislocations are also discussed. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.114859
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