ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We describe a fiber-optic interferometer that employs wavelength changes to achieve maximum sensitivity. Wavelength changes are induced by adjusting the operating temperature of the laser, eliminating the need for an actuator to vary the spacing between the sensing fiber and the object to be monitored. The instrument and techniques described are suitable for cryogenic, high vacuum applications such as magnetic resonance force microscopy, where space is limited and micromanipulation can be challenging. The noise floor of 1.6×10−3 nm/Hz is adequate for monitoring subangstrom displacement of force microscope cantilevers. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1149947
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