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  • 1
    Electronic Resource
    Electronic Resource
    Scanning near-field optical microscopy based on the heterodyne phase-controlled oscillator method (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 2921-2927 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The heterodyne phase-controlled oscillator method to monitor the resonance frequency and quality factor of the tip oscillations was used to control the scanning near-field optical microscope (SNOM) and to study the nature of the shear-force interaction routinely used in SNOM. Both optical and nonoptical (tuning fork-based) detection schemes of the shear force have been investigated using the same electronic unit, which enables a direct comparison of the results. It is shown that the possibility to record simultaneously the topography and dissipative interaction (Q-factor) channels gives additional information about the sample and helps to interpret the data in a manner analogous to that of a usual dynamic force microscope. The peculiarities of the recorded approach curves (increase of the resonance frequency and Q factor when the tip approaches the sample) are consistent with the "repetitive bumping" mechanism of tip–sample interaction for the shear force. Evidence for the transition from the bumping to the permanent sliding mechanism has been obtained for the case of larger vibration amplitudes of the tip. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1287234
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  • 2
    Electronic Resource
    Electronic Resource
    Creation of a conductive surface layer on polypropylene samples by low-pressure plasma treatments (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 5695-5701 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Polypropylene (PP) samples were treated in an electron cyclotron resonance plasma with several gases and under different treatment conditions (pressure, treatment time, rf potential). The surfaces were chemically characterized in situ by x-ray photoelectron spectroscopy (XPS). Changes in the electrical resistance of the surface layer were analyzed by four points measurements. Noble gas plasma treatments led to a great decrease (ten orders of magnitude) of the resistance, whereas reactive gas plasma treatments induced no modification of the resistance. Taking into account that the treated layer corresponds to the ion penetration depth, an estimation gives 0.1 Ω cm for the bulk resistivity of He plasma treated PP. For noble gases, this value depends on the plasma gas and on the ion kinetic energy. The resistance decrease is explained by a dehydrogenation and an increase of carbon–carbon bonds. During reactive gas plasma treatments, the incorporation of new chemical species prevents this graphitization. Correlations of the resistance with XPS measurements and comparisons with literature on high energetic ion treatments allow a better understanding of the effects of the plasma treatment. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359211
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  • 3
    Electronic Resource
    Electronic Resource
    Plasma modification of polymethylmethacrylate and polyethyleneterephthalate surfaces (1994)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 76 (1994), S. 887-892 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Noble gas (He,Ar,Xe) and reactive gas (O2,N2) plasma treatments of polymethylmethacrylate (PMMA) and polyethyleneterephthalate (PET) surfaces were performed in an electron-cyclotron-resonance plasma. In situ surface analysis by x-ray photoelectron spectroscopy reveals well-defined surface compositions. From these measurements it is concluded that, independently of the plasma gas, the plasma ions easily decompose the ester group in PMMA in its constituents by an ion-electron recombination process, while in PET the ester decomposition is less pronounced. The difference is ascribed to the presence in PET of a phenyl ring, which protects the ester group by various mechanisms. The study of O2 plasma treatments shows that the equilibrium between the depletion of oxygen and the incorporation of the reactive species in the polymer surface is solely determined by the ion current. The plasma-polymer interactions are qualitatively explained by simple rules of intermolecular forces and ion-electron recombination phenomena.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.357765
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  • 4
    Electronic Resource
    Electronic Resource
    Atomic force and scanning tunneling microscopy study of current-voltage properties of TiB2 microcontacts (1997)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 82 (1997), S. 1255-1261 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Scanning probe microscopy was used to investigate electrical microcontacts in the nanometer range. With the atomic force microscope current flowing through the contact as well as current-voltage characteristics of the contact as a function of the force acting on the contact itself were recorded. With the scanning tunneling microscope current-voltage characteristics and voltage at constant current characteristics were measured as a function of the contact position. From these experiments we conclude that a TiB2 microcontact can sustain a maximum voltage of about 0.1–1 V before melting. These results were confirmed by a theoretical model. The implications for the functioning of so-called positive temperature coefficient current limiting devices based on filled polymers is discussed. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.365896
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  • 5
    Electronic Resource
    Electronic Resource
    Energy dissipation during nanoscale indentation of polymers with an atomic force microscope (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 3566-3568 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nanometer size indentations on polypropylene and polymethylmethacrylate were made with the atomic force microscope and were 200-nm wide and 20-nm deep for a tip penetration depth of 75 nm. To image the indentations with the same tip used for writing, the tip was retracted at high speed, thus detaching any polymer sticking on it. Nanomechanical properties of polymer are studied in the limit of shallow indentations and slow penetration speed. From the hysteresis of the force versus tip motion curve, the dissipated energy during the indentation and the inelastic deformation of the polymer surface can be measured. We find that the measured dissipated energy is proportional to the volume of the indentation times the activation energy needed to excite chain segments motion during the deformation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.111199
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  • 6
    Electronic Resource
    Electronic Resource
    Energy dissipation during nanoscale indentation of polymers with an atomic force microscope (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 1794-1796 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Nanometer size indentations on polypropylene and polymethylmethacrylate were made with the atomic force microscope and were 200-nm wide and 20-nm deep for a tip penetration depth of 75 nm. To image the indentations with the same tip used for writing, the tip was retracted at high speed, thus detaching any polymer sticking on it. Nanomechanical properties of polymer are studied in the limit of shallow indentations and slow penetration speed. From the hysteresis of the force versus tip motion curve, the dissipated energy during the indentation and the inelastic deformation of the polymer surface can be measured. We find that the measured dissipated energy is proportional to the volume of the indentation times the activation energy needed to excite chain segments motion during the deformation.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.112003
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  • 7
    Electronic Resource
    Electronic Resource
    Investigation of nanolocal fluorescence resonance energy transfer for scanning probe microscopy (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 3453-3455 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Fluorescence resonance energy transfer (FRET) has been observed between donor dye molecules deposited onto the sample surface and acceptor dye molecules deposited onto the scanning near-field optical microscope (SNOM) or atomic force microscope tip. FRET was observed only when the tip acquired a contact with the sample and took place in a region of few tens of square nanometers in size when thousands (hundreds) of molecules are involved. In view of the obtained results, the perspectives for the construction of a one-atom FRET SNOM are described. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.124125
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  • 8
    Electronic Resource
    Electronic Resource
    Local fluorescent probes for the fluorescence resonance energy transfer scanning near-field optical microscopy (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 2625-2627 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We present fluorescence resonance energy transfer (FRET) images of donor dye molecule clusters recorded using a local fluorescence probe for scanning near-field optical microscopy (SNOM): standard apertured SNOM fiber tip coated with the 30–100-nm-thick polymer layer stained with the acceptor dye molecules. The tip works as a "self-sharpening pencil": the apical layers of the FRET-active tip coating are mechanically worn out during scanning thus continuously exposing a fresh active apex to continue imaging. Only a few tens of acceptor molecules are used to form the optical images, and using such an approach spatial resolution better than the size of the aperture is achievable. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1467695
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  • 9
    Electronic Resource
    Electronic Resource
    Time-gated scanning near-field optical microscopy (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 2089-2091 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A time-gated scanning near-field optical microscope (SNOM) has been developed. The optical signal was recorded at the precise moment during the fiber tip oscillation period when it made contact with the sample surface. The use of such an approach substantially improves the signal-to-noise ratio for common SNOM applications such as frustrated total internal reflection, surface plasmon imaging, and fluorescence resonance energy transfer-based SNOM. The observed dependence of the frustrated total internal reflection optical signal on the gate delay time confirms that repetitive bumping is the mechanism responsible for the shear force tip–sample interaction. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1314287
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  • 10
    Electronic Resource
    Electronic Resource
    New aspects in Volmer-Weber 3D growth: an XPS intensity study applied to thin films of Au and Ce on polypropylene
    Amsterdam : Elsevier
    Surface Science 314 (1994), S. 13-22 
    Details
    ISSN: 0039-6028
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0039-6028(94)90209-7
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