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    High Accuracy Thermal Expansion Measurement At Cryogenic Temperatures (2003)
    In:  Other Sources
    Details
    Publication Date: 2019-07-18
    Description: A new, interferometer based system for measuring thermal expansion to an absolute accuracy of 20 ppb or better at cryogenic temperatures has been developed. Data from NIST Copper SRM 736 measured from room temperature to 15 K will be presented along with data from many other materials including beryllium, ULE, Zerodur, and composite materials. Particular attention will be given to a study by the Space Optics Manufacturing Technology Center (SOMTC) investigating the variability of ULE and beryllium materials used in the AMSD program. Approximately 20 samples of each material, tested from room temperature to below 30 K are compared as a function of billet location.
    Keywords: Instrumentation and Photography
    Type: SPIE Optical Science and Technology Conference; Aug 03, 2003 - Aug 08, 2003; San Diego, CA; United States
    Format: text
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