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Examination of Wax-Coated RDX by scanning electron microscopy and X-ray photoelectron spectroscopy (1985)

Cowey, K. ; Day, S. ; Fryer, R.

Weinheim : Wiley-Blackwell

Propellants, Explosives, Pyrotechnics 10 (1985), S. 61-64

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ISSN: 0721-3115

Keywords: Chemistry ; Polymer and Materials Science

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology

Notes: Scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) have been used to examine the nature and quality of wax-coated RDX crystals. SEM allows a visual assessment of wax-coated crystals and comparison of different coating processes. XPS has allowed a semiquantitative determination of the degree of wax coverage by measurement of the carbon to nitrogen photoelectron emissions and calculation of the percentage of wax coverage using a simple mathematical treatment.

Additional Material: 7 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/prep.19850100302

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