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  • 1
    Electronic Resource
    Electronic Resource
    Mass and geometry effects on the anisotropic transport in ion mixing (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 58 (1991), S. 586-588 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Experimental investigations of the effect of target species atomic mass and system geometry on the anisotropic transport in the ion mixing of metallic systems are reported. Bilayer samples with zero heats of mixing and similar cohesive energies, but different atomic mass and geometry, such as Ta on top of Nb(Ta/Nb), Nb on top of Ta(Nb/Ta), Hf on top of Zr (Hf/Zr), and Zr on top of Hf(Zr/Hf) were irradiated by 300 keV Kr2+ at a dose of 2 × 1016 Kr2+/cm2 at 77 K. The samples were investigated using embedded markers and Rutherford backscattering spectrometry. The experimental results indicate that the anisotropic transport is dominated by a preferential displacement of the top layer species into the bottom layer. This is probably due to an anisotropy in the momentum distribution within the collision cascade. In addition, there is an enhancement of the inward displacement when the lighter species is on top indicating a small preferential recoil displacement of the lighter species over the heavier one.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.104595
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  • 2
    Electronic Resource
    Electronic Resource
    Effect of ion mixing on the depth resolution of sputter depth profiling (1988)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 53 (1988), S. 1346-1348 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The effect of ion mixing on the depth resolution of sputter depth profiling has been studied using x-ray photoelectron spectroscopy and Ar+ sputtering of Pt/Zr, Pt/Mo, Pt/Ti, and Pt/Ni interfaces. It is shown that the heat of mixing of binary alloys plays an important role in depth resolution. The measured interface width of bilayers consisting of metals with a large and negative heat of mixing (Pt/Zr and Pt/Ti) is significantly broader than that of metals with a nearly zero heat of mixing (Pt/Mo and Pt/Ni). This observation suggests that the mechanism of ion mixing during sputter depth profiling with ion energies of a few keV is the same as ion mixing with ion energies of several hundred keV; diffusion in thermal spikes is the dominant contribution to ion mixing in the systems investigated.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.99977
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  • 3
    Electronic Resource
    Electronic Resource
    Scaling approach to conical indentation in elastic-plastic solids with work hardening (1998)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 84 (1998), S. 1284-1291 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We derive, using dimensional analysis and finite element calculations, several scaling relationships for conical indentation in elastic-plastic solids with work hardening. Using these scaling relationships, we examine the relationships between hardness, contact area, initial unloading slope, and mechanical properties of solids. The scaling relationships also provide new insights into the shape of indentation curves and form the basis for understanding indentation measurements, including nano- and micro-indentation techniques. They may also be helpful as a guide to numerical and finite element calculations of indentation problems. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.368196
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  • 4
    Electronic Resource
    Electronic Resource
    Recovery of microindents in a nickel–titanium shape-memory alloy: A "self-healing" effect (2002)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 80 (2002), S. 3310-3312 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The thermally induced recovery of microscopic deformation in a nickel–titanium shape-memory alloy was examined. Surface deformation was simulated by indenting the alloy in the martensite phase at room temperature using both spherical and pyramidal indenters. We show that deformation in spherical microindents can be almost completely reversed by moderate heating. Partial recovery was observed for pyramidal impressions formed by a Vickers indenter and the recovery ratio was independent of the indentation depth. The observations were rationalized using the concept of representative strain and maximum stress under the spherical and pyramidal indenters. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1476064
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  • 5
    Electronic Resource
    Electronic Resource
    Relationships between hardness, elastic modulus, and the work of indentation (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 614-616 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The work done during indentation is examined using dimensional analysis and finite element calculations for conical indentation in elastic-plastic solids with work hardening. An approximate relationship between the ratio of hardness to elastic modulus and the ratio of irreversible work to total work in indentation is found. Consequently, the ratio of hardness to elastic modulus may be obtained directly from measuring the work of indentation. Together with a well-known relationship between elastic modulus, initial unloading slope, and contact area, a new method is then suggested for estimating the hardness and modulus of solids using instrumented indentation with conical or pyramidal indenters. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.121873
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  • 6
    Electronic Resource
    Electronic Resource
    Epitaxial growth of α-Fe films on Si(111) substrates (1991)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 59 (1991), S. 953-955 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial α-Fe films have been grown on HF cleaned Si(111) substrates at 30 °C by electron beam evaporation in an ultrahigh vacuum environment to a thickness of several thousands of Angstroms. Conventional θ−2θ x-ray diffraction shows that only the Fe(222) peak is present, indicating that the films are oriented with the Fe(111) plane parallel to the Si(111) plane. Transmission electron microscopy shows that the Fe[11¯0] direction is parallel to the Si[11¯0] direction in the plane of the substrate.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.106312
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  • 7
    Electronic Resource
    Electronic Resource
    Epitaxial growth of double hexagonal close-packed Nd on the α-Fe (111) surface (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 60 (1992), S. 1951-1953 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial double hexagonal close-packed (dhcp) Nd layers have been grown on the (111) surface of α-Fe at 320 °C by electron beam evaporation in an ultrahigh vacuum environment. Conventional θ-2θ diffraction and transmission electron microscopy show that the dhcp Nd films are oriented with the dhcp Nd (0001) plane parallel to the α-Fe(111) plane and with the dhcp Nd [112¯0] direction parallel to the Fe[11¯0] direction in the plane of the substrate. An epitaxial Fe/Nd/Fe trilayer structure with the same orientational relationships has also been made.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107134
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  • 8
    Electronic Resource
    Electronic Resource
    Thermodynamics of Some Concentrated High Polymer Solutions (1974)
    s.l. : American Chemical Society
    Industrial and engineering chemistry 13 (1974), S. 437-441 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/i260052a024
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  • 9
    Electronic Resource
    Electronic Resource
    Noninteracting Control (1975)
    s.l. : American Chemical Society
    Industrial and engineering chemistry 14 (1975), S. 193-195 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Process Engineering, Biotechnology, Nutrition Technology
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/i260054a018
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  • 10
    Electronic Resource
    Electronic Resource
    Poly(alkyl thiophene-3-carboxylates). Synthesis and Characterization of Polythiophenes with a Carbonyl Group Directly Attached to the Ring (1995)
    s.l. : American Chemical Society
    Macromolecules 28 (1995), S. 5706-5708 
    Details
    ISSN: 1520-5835
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/ma00121a003
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