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  • 1
    Electronic Resource
    Electronic Resource
    Adsorption-induced surface stress and its effects on resonance frequency of microcantilevers (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3618-3622 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: It is well known that bimetallic microcantilevers can exhibit static deflection as a result of thermal effects, including exothermic adsorption of chemicals on their surfaces. It is shown here that the resonance frequency of a cantilever can change due to a combination of mass loading and change of spring constant resulting from adsorption of chemicals on the surface. Cantilevers also undergo static bending that is induced by differential surface stress. The magnitude of these effects depends upon the chemical properties of the surface and upon the amount of material adsorbed. Hence cantilever deflection as well as resonance frequency change can be used as the basis for development of novel chemical sensors. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.359562
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  • 2
    Electronic Resource
    Electronic Resource
    Harmonic response of near-contact scanning force microscopy (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 1465-1469 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: One-dimensional harmonic oscillator theory was used to model tapping-mode atomic force microscope (TMAFM) operation in the near-contact region in the presence of gases and liquids. The force derivative of the tip-sample interaction changes the vibration amplitude and frequency at maximum amplitude of the cantilever. Additionally, the interaction is hydrodynamically damped by fluid motion around the tip and between the tip and the surface. Good agreement was found between theoretical and experimental amplitude as a function of height. For a sample-driven TMAFM operating in fluids, the cantilever can be very soft (spring constant (very-much-less-than)1 N/m) and operated at frequencies well above the fundamental. Under these conditions the cantilever and sample appear to act with a high spring constant, much like that used in a gaseous operation. The tip–sample interaction in the fluid is still mediated through the force derivative of the sample. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360304
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  • 3
    Electronic Resource
    Electronic Resource
    Resonance response of scanning force microscopy cantilevers (1994)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 65 (1994), S. 2532-2537 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A variational method is used to calculate the deflection and the fundamental and harmonic resonance frequencies of commercial V-shaped and rectangular atomic force microscopy cantilevers. The effective mass of V-shaped cantilevers is roughly half that calculated for the equivalent rectangular cantilevers. Damping by environmental gases, including air, nitrogen, argon, and helium, affects the frequency of maximum response and to a much greater degree the quality factor Q. Helium has the lowest viscosity, resulting in the highest Q, and thus provides the best sensitivity in noncontact force microscopy. Damping in liquids is dominated by an increase in effective mass of the cantilever due to an added mass of the liquid being dragged with that cantilever.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144647
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  • 4
    Electronic Resource
    Electronic Resource
    Electron field emission from Ti-containing tetrahedral amorphous carbon films deposited by filtered cathodic vacuum arc (2000)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 6842-6847 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Titanium-containing tetrahedral amorphous carbon (ta-C:Ti) films with different titanium content were deposited by a filtered cathodic vacuum arc technique. The microstructure of these films was confirmed to be of ta-C+TiCx(x〈1) nanocomposite by Rutherford backscattering spectroscopy, x-ray diffraction, and micro-Raman spectroscopy experiments. With the increase of titanium content, the titanium carbide content increased and the sp3 fraction in the residual ta-C phase decreased gradually. In the electron field emission tests, it was found that proper conditioning processes are necessary for all these films in order to get a steady reproducible emission behavior. After conditioning, the emission threshold field of the films is about the same value, around 10 V/μm, except for the film with the lowest titanium content (∼1.2 at%) of which the threshold field is much higher, around 17–18 V/μm. The optimum titanium concentration in the film for field emission, showing the highest emission current and emission site density, is about 12 at%. After field emission testing, graphitization was involved and the titanium carbide phase, at least some of the sub-stoichiometric TiCx phase, in the ta-C:Ti films decomposed. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1323541
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  • 5
    Electronic Resource
    Electronic Resource
    Surface energy of amorphous carbon films containing iron (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7814-7819 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Iron containing diamond-like amorphous carbon (a-C:Fe) films were deposited by filtered cathodic vacuum arc technique. The influences of Fe content and substrate bias on the surface energy of the films were investigated. The surface energy of a-C:Fe films was determined by the contact angle measurement. Atomic force microscopy, Raman spectroscopy, and x-ray induced photoelectron spectroscopy were employed to analyze the origin of the variation of surface energy with various Fe content and substrate bias. It is found that the contact angle for water increases significantly after incorporating Fe into the films and the films become hydrophobic. The roughness of these films has no effect on the contact angle. The surface energy is reduced from 42.8 to 25 dyne/cm after incorporating Fe into the a-C film (10% Fe in the target), which is due to the reduction of both dispersive and polar component. The reduction in dispersive component is ascribed to the decrease of atomic density of the a-C:Fe films due to the increase in sp2 bonded carbon. When sp2 content increases to some extent, the atomic density remains constant and hence dispersive component does not change. The absorption of oxygen on the surface plays an important role in the reduction of the polar component for the a-C:Fe films. It is proposed that such network as (Cn–O–Fe)–O–(Fe–O–Cn) may be formed and responsible for the reduction of polar component. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1375808
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  • 6
    Electronic Resource
    Electronic Resource
    Field emission from cobalt-containing amorphous carbon composite films heat-treated in an acetylene ambient (2000)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 77 (2000), S. 2021-2023 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Cobalt-containing amorphous carbon composite films have been prepared by the filtered cathodic arc technique using a cobalt-containing graphite target at room temperature. After heat treatment at 550 °C in a mixture of acetylene and nitrogen gases, the field emission properties were significantly improved. A threshold electric field of 1.7 V/μm and an emission site density of 105/cm2 were obtained without conditioning. The composite films, which can be deposited with a high rate at room temperature and require a relatively low temperature heat-treatment process to enhance electron emission, are promising for practical applications in field emission display. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1313252
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  • 7
    Electronic Resource
    Electronic Resource
    Carbon nanotube films prepared by thermal chemical vapor deposition at low temperature for field emission applications (2001)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 79 (2001), S. 1670-1672 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Mirror-like smooth carbon nanotube (CNT) films were grown by thermal chemical vapor deposition on glass substrate at a relatively low temperature of 570 °C. Cobalt-containing amorphous carbon composite films were employed as a catalyst layer for the growth of CNTs by decomposing acetylene in a tube furnace. The diameter of the CNTs was around 10 nm and the root-mean-square roughness of the film was about 12 nm, indicating a relatively smooth surface. A high emission current density of 12 mA/cm2 and relatively uniform emission sites were obtained from this type of CNT films. The relatively smooth CNT films, which can be deposited at low temperature on glass substrates and compatible with current semiconductor processes, have a potential for fabricating high-density gated CNT field emitter array. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1391397
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  • 8
    Electronic Resource
    Electronic Resource
    Viscous drag measurements utilizing microfabricated cantilevers (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 68 (1996), S. 3814-3816 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The influence of viscous drag forces on cantilevers is investigated using standard atomic force microscope (AFM) cantilevers. Viscosity effects on several geometrically different cantilevers manifest themselves as variations in resonance frequencies, quality factors, and cantilever response amplitudes. With this novel measurement, a single cantilever can be used to measure viscosities ranging from η=10−2 to 102 g/cm s. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.116626
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  • 9
    Electronic Resource
    Electronic Resource
    Characterization of atomic force microscope tips by adhesion force measurements (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2150-2152 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The resolution limit in an atomic force microscope image usually is attributed to the finite radius of the contacting probe. Here, it is shown that this assumption is valid only when adhesion forces are minimal. Relative to the tip-imposed geometrical limit, the resolution and contrast in AFM images can be degraded by increasing adhesion forces. The large adhesion forces observed for some tips at low humidity conditions are shown to be due to tip contamination or poorly formed tip apexes. Methods to determine and to reduce the extent of tip contamination are described. Cleaning carried out using UV-ozone or oxygen-plasma etching were found to significantly reduce the minimum adhesion force.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.110569
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  • 10
    Electronic Resource
    Electronic Resource
    Thermal and ambient-induced deflections of scanning force microscope cantilevers (1994)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 64 (1994), S. 2894-2896 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The deflection of scanning force microscope cantilevers, metal coated on one side, is significantly influenced by both thermal heating and variations in relative humidity. For constant relative humidity, the deflection of the cantilever drifts due to laser heating and eventually reaches a steady-state value. For a thermally stabilized cantilever, the deflection varies linearly with relative humidity. Exposure to other vapors, such as mercury, changes the inherent deflection of the cantilever. Relative amounts of adsorbates on the cantilever can be estimated from shifts in the cantilever resonance frequency with picogram mass resolution. The cantilever deflection as well as changes in resonance frequency due to vapor adsorption can be used as basis for novel chemical sensors.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.111407
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