ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A procedure for synthesizing the x-ray intensity profile for x-ray optical systems employing curved diffractors is presented. The synthesis takes account of the effects of misalignment, the solid angle, and the convergence or divergence of the diffracted x rays. Broadening effects due to finite source size, wavelength spread, and presence of polychromatic radiation have also been included. The broadening effects on the intensity profile are demonstrated analytically. By comparing experimental results with results from the synthesis method, curved diffractor's parameters (rocking curve width and peak reflectivity) were quantitatively evaluated for mica, silicon, graphite, and LiF crystals at three x-ray wavelengths.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.354615
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