ISSN:
1573-482X
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The physical and electrical characteristics of CdS thin films deposited by vacuum evaporation, solution growth and spray pyrolysis were analysed. The effects of the common grain growth promoter CdCl2 and annealing were investigated. Grain size, bulk composition and surface composition were measured by energy-dispersive X-ray fluorescence, Auger spectroscopy and scanning electron microscopy. Schottky diode analysis was performed to study the electrical characteristics of the films, and energy band gap was measured by spectral transmission.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1018537928315
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