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  • 1
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    Secondary electron emission from a charged dielectric (1985)
    In:  Other Sources
    Details
    Publication Date: 2011-08-19
    Description: Charges on the surface of fluorinated-ethylene-propylene affect its secondary electron emission coefficient. Measurements with impact energies exceeding that energy which causes peak emission have been made in regions where the local electric field produced by the surface charge is normal to the surface and in regions where it is oblique. The surface of the 6-mm wide specimen was charged to either 6 or 10 kV. Because the impinging primary beam was deflected by the charged specimen, numerical modeling was used to predict the beam's impact energy E, impact angle theta, and the impact point. The formula predicts the coefficient in the region of normal field up to 60 deg although E(0) depends upon the electric field and also on the history of the specimen. Near the edges where the field is oblique, the measured coefficient departs significantly from what the formula predicts.
    Keywords: ELECTRONICS AND ELECTRICAL ENGINEERING
    Type: IEEE Transactions on Electrical Insulation (ISSN 0018-9367); EI-20; 485-491
    Format: text
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    NASA TECHNICAL REPORTS
  • 2
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    Secondary electron emission from electrically charged fluorinated-ethylene-propylene Teflon for normal and non-normal electron incidence (1981)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: The secondary electron emission coefficient was measured for a charged polymer (FEP-Teflon) with normally and obliquely incident primary electrons. Theories of secondary emission are reviewed and the experimental data is compared to these theories. Results were obtained for angles of incidence up to 60 deg in normal electric fields of 1500 V/mm. Additional measurements in the range from 50 to 70 deg were made in regions where the normal and tangential fields were approximately equal. The initial input angles and measured output point of the electron beam could be analyzed with computer simulations in order to determine the field within the chamber. When the field is known, the trajectories can be calculated for impacting electrons having various energies and angles of incidence. There was close agreement between the experimental results and the commonly assumed theoretical model in the presence of normal electric fields for angles of incidence up to 60 deg. High angle results obtained in the presence of tangential electric fields did not agree with the theoretical models.
    Keywords: SOLID-STATE PHYSICS
    Type: NASA-CR-163968
    Format: application/pdf
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    NASA TECHNICAL REPORTS
  • 3
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    Oblique-incidence secondary emission from charged dielectrics (1980)
    In:  CASI
    Details
    Publication Date: 2019-06-28
    Description: Secondary electron emission coefficients were measured on FEP-Teflon for normal and oblique incidence in the presence of a normal electric field. Such measurements require knowledge of the electrostatic environment surrounding the specimen, and they require calculation of particle trajectories such that particle impact parameters can be known. A simulation using a conformal mapping, a Green's integral, and a trajectory generator provides the necessary mathematical support for the measurements, which were made with normal fields of 1.5 and 2.7 kV/mm. When incidence is normal and energy exceeds the critical energy, the coefficient is given by (V sub 0/V) to the .58 power, and for oblique incidence this expression may be divided by the cosine of the angle. The parameter V sub 0 is a function of normal field.
    Keywords: SOLID-STATE PHYSICS
    Type: NASA-CR-163714
    Format: application/pdf
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  • 4
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    Oblique-incidence secondary emission from charged dielectronics (1981)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: Experimental measurements and computer simulation of secondary electron emission coefficients for FEP-Teflon, for normal and oblique incidence in the presence of a normal electric field are reported. Knowledge of the electrostatic environment surrounding the specimen calculation of particle trajectories are considered. A simulation using a conformal mapping, a Green's integral, and a trajectory generator provides the necessary mathematical support for the measurements which have been made with normal fields of 1.5 and 2.7 kV/mm. When incidence is normal and energy exceeds the critical energy, the coefficient is given by V.58 and for oblique incidence this expression may be divided by the cosine of the angle. The parameter V sub 0 is a function of normal field. Measurements for values of V sub f are presented.
    Keywords: SPACECRAFT DESIGN, TESTING AND PERFORMANCE
    Type: NASA. Lewis Research Center Spacecraft Charging Technol., 1980; p 198-210
    Format: text
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    NASA TECHNICAL REPORTS
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