ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
An XRF device using polarized x-rays for trace element analysis of rocks and soils has been developed. During a measuring time of 1000 s (two single measurements of 750 and 250 s, respectively), 36 elements with atomic numbers 22 ≤ Z ≤ 92 and detection limits between 15 and 0.3 ppm can be determined with high precision. The ratio between the net counts from a characteristic line of the element being determined and the number of background counts caused mainly by Compton scattering is used for the matrix correction procedure. Absorption and enhancement effects by major sample element concentrations are taken into account. Good agreement was found between analytical results and certified values for standard reference materials.
Additional Material:
6 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300200608
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