Electronic Resource
Copenhagen
:
International Union of Crystallography (IUCr)
Applied crystallography online
2 (1969), S. 18-24
ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
The usual method of specimen preparation for electron-probe microanalysis can introduce errors of up to about ±3% in the estimates of the amount of an element present. It is believed that these errors are caused by the formation of `flowed' layers on the surfaces of polished samples. Two methods of reducing the errors are described.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S002188986900642X
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