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Electron-stimulated desorption, secondary emission and charging of ionic crystals (1990)

Atabaev, B. G. ; Besedina, E. A. ; Kareev, M. S. ; [et al.]

Chichester [u.a.] : Wiley-Blackwell

Surface and Interface Analysis 16 (1990), S. 475-479

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ISSN: 0142-2421

Keywords: Chemistry ; Polymer and Materials Science

Source: Wiley InterScience Backfile Collection 1832-2000

Topics: Physics

Notes: Negative and positive charging of ionic monocrystals (KCl, NaCl, Al2O3, MgO, SiO2 and LiH) under low-energy electron irradiation is investigated by AES and mass spectrometry. Secondary emission and electron-stimulated desorption negative ions of LiH data are presented. The mass spectra of sputtered neutrals post-ionized into negative ions, and their ionization coefficients on the auxiliary target with a low work function, are presented. A phenomenological model of charging of dielectrics that depends on defect formation and secondary emission properties under low-energy electron irradiation is presented.

Additional Material: 4 Ill.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1002/sia.7401601100

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