ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The contribution presents results of the measurements of the homogeneity of the main elements of the FeAl intermetallic alloys as well as the distributions of the light contamination: H, C, O, in investigated samples. The program used for the data processing gives us the possibility of the layer analysis (inside the target material) of the element distributions. Such layer analysis differentiates between the light elements absorbed on the surface of the investigated sample and the same elements contributed as the components of the alloy. The measurements were performed by means of the ion analyzer of mass-reflectron type (MR) with laser ionization of the investigated materials. This method consists of the separation of ions of different mass-to-charge ratios Mi/Z. This separation is accomplished by the time-of-flight method, equivalent to the various arrival times of ions with different Mi/Z ratios and similar energy. The laser power density was chosen during the measurements in such a way that the majority of produced ions had a charge state Z=1. In this case, the time-of-flight method makes possible the separation of ions with different masses Mi. The high mass resolution (M/ΔM∼1000) of the MR makes it very useful for investigations of the chemical compositions of alloys. It enables a registration of all elements from hydrogen up to uranium with sensitivity of about 1 ppm. © 1998 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1148594
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