ALBERT

All Library Books, journals and Electronic Records Telegrafenberg

X
feed icon rss

Your email was sent successfully. Check your inbox.

An error occurred while sending the email. Please try again.

Proceed reservation?

Export
  • 1
    facet.materialart.
    Unknown
    Total Ionizing Dose Response of SDRAM, DDR2 and DDR3 Memories (2016)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: Total Ionizing Dose response (ID) of SDRAM (Synchronous Dynamic Random Access Memory), DDR2 (Double Data Rate2) and DDR3 (Double Data Rate3) memories is reported in static bias, and auto refresh modes. Data analysis reveals some types of memory have significant increases in stuck bits during TID exposure when refreshed.
    Keywords: Computer Operations and Hardware; Space Radiation
    Type: JPL-CL-16-3676 , IEEE Nuclear And Space Radiation Effects Conference (NSREC 2016); Jul 11, 2016 - Jul 15, 2016; Portland, OR; United States
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 2
    facet.materialart.
    Unknown
    Single Event Testing of SDRAM, DDR2 and DDR3 Memories (2016)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: SEE test results are presented for SDRAM, DDR2, and DDR3. No tested devices exhibited SEL. SBUs were observed, but no MBUs were observed in data words. SEFI data were taken at low and high speed.
    Keywords: Mathematical and Computer Sciences (General)
    Type: JPL-CL-16-3581 , 2016 Nuclear And Space Radiation Effects Conference; Jul 11, 2016 - Jul 15, 2016; Portland, OR; United States
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 3
    facet.materialart.
    Unknown
    Reliability Characterization of TaOx-Based Commercial ReRAM in Combination with Radiation (2016)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: We present reliability data combined with total dose gamma radiation for one of the first commercially available resistive memory devices. These Tantalum Oxide (TaOX)-based resistive memory chips demonstrate operation in dynamic program and erase testing up to ~130 Krad(Si) of 60Co gamma dose. In static and unbiased conditions, the stored data in the memory cells were able to withstand up to 50Mrad(Si) of exposure. The access circuitry, though, seemed less robust to gamma radiation and was able to operate only up to a total dose of 3Mrad(Si). Post exposure reliability as indicated by endurance, cycling error rate, and data retention tests showed no detectable impact from the combination with prior gamma irradiation. Overall, the total dose radiation tolerance of the commercial TaOx-based resistive memory chip appears to be higher than flash memory chips and in agreement with prior tests conducted with single cell resistive memories.
    Keywords: Electronics and Electrical Engineering
    Type: JPL-CL-16-0508 , IEEE International Memory Workshop (IMW); May 15, 2016 - May 18, 2016; Paris; France
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 4
    facet.materialart.
    Unknown
    CubeSat Microcontrollers (2016)
    In:  Other Sources
    Details
    Publication Date: 2019-12-28
    Description: No abstract available
    Keywords: Spacecraft Design, Testing and Performance
    Type: JPL-CL-16-2505 , 2016 Electronics Technology Workshop (ETW); Jun 13, 2016 - Jun 16, 2016; Greenbelt, MD; United States
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
  • 5
    facet.materialart.
    Unknown
    Radiation Test Results for Common CubeSat Microcontrollers and Microprocessors (2015)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: SEL, SEU, and TID results are presented for microcontrollers and microprocessors of interest for small satellite systems such as the TI MSP430F1611, MSP430F1612 and MSP430FR5739, Microchip PIC24F256GA110 and dsPIC33FJ256GP710, Atmel AT91SAM9G20, and Intel Atom E620T, and the Qualcomm Snapdragon APQ8064.
    Keywords: Electronics and Electrical Engineering; Space Radiation
    Type: 2015 Nuclear and Space Radiation Effects Conference; Jul 13, 2015 - Jul 17, 2015; Boston, MA; United States
    Format: text
    Location Call Number Expected Availability
    BibTip Others were also interested in ...
    NASA TECHNICAL REPORTS
Close ⊗
This website uses cookies and the analysis tool Matomo. More information can be found here...