Publication Date:
2018-05-09
Description:
Author(s): A. Sawada, S. Faniel, S. Mineshige, S. Kawabata, K. Saito, K. Kobayashi, Y. Sekine, H. Sugiyama, and T. Koga We report an approach for examining electron properties using information about the shape and size of a nanostructure as a measurement reference. This approach quantifies the spin precession angles per unit length directly by considering the time-reversal interferences on chaotic return trajectories... [Phys. Rev. B 97, 195303] Published Tue May 08, 2018
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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