ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
The SpectroMicroscopy Facility at the Advanced Light Source is based on a high brightness, high-resolution beamline, and includes a collection of projects designed to exploit the unique characteristics of the soft x-ray beam. The beamline itself is comprised of a 5-m long, 5-cm-period undulator, a spherical-grating monochromator with water-cooled gratings. Adaptive optics refocus the monochromatic beam to two "microfocus'' experimental stations with spot sizes less than 50 μm diameter and a third "nanofocus'' station uses a zone-plate lens to further demagnify the microfocus spot. Experimental stations include an "ultraESCA'' spectrometer for small-area spectroscopy and photoelectron diffraction, a scanning transmission x-ray microscope, and photoelectron microscopes. Commissioning experiments of microscopic actinide photoemission, surface-core-level photoelectron diffraction, and high-resolution soft x-ray fluorescence demonstrate dramatic improvements in sensitivity due to the high brightness and small focus of the beamline. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145969
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