Publikationsdatum:
2016-10-18
Beschreibung:
High precision measurements of optical beam shifts are important in various fields including sensing, atomic force microscopy, and measuring beam shifts at interfaces. Sub-micron shifts are generally measured by indirect techniques such as weak measurements. We demonstrate a straightforward and robust measurement scheme for the shift, based on a scanning quadrant photodiode (QPD) that is biased using a low noise electronic circuit. The shift is measured with respect to a reference beam that is co-propagating with the signal beam. Thus, the shift of the signal beam is readout directly as the difference between the x-intercepts of the QPD scan plot of the signal and reference beams versus the position of the detector. To measure the beam shift, we use polarization multiplexing scheme where the p-polarized signal and s-polarized reference beams are modulated at two different frequencies and co-launched into a polarization-maintaining fiber. Both the signal and reference beam positions are readout by two lock-in amplifiers simultaneously. In order to demonstrate the utility of this method, we perform a direct measurement of Goos-Hänchen shift of a beam that is reflected from a plane gold surface. Accuracy of 150 nm is achieved using this technique.
Print ISSN:
0034-6748
Digitale ISSN:
1089-7623
Thema:
Elektrotechnik, Elektronik, Nachrichtentechnik
,
Physik
Permalink
