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  • 1
    Publication Date: 1980-11-01
    Print ISSN: 0002-7820
    Electronic ISSN: 1551-2916
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Published by Wiley on behalf of American Ceramic Society.
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  • 2
    Publication Date: 2019-07-16
    Repository Name: EPIC Alfred Wegener Institut
    Type: Article , isiRev
    Format: application/pdf
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 60 (1986), S. 4191-4196 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In order to obtain semiconductivity, rutile crystals have been doped with Nb by means of diffusion. The resulting Nb-doped rutile crystals have an electrical resistivity (approximately-equal-to)80 Ω cm at room temperature. Impedance analysis of a Nb-doped TiO2-Au diode suggests that the measurement frequency must be lower than 10 kHz to detect the capacitance and conductance of the depletion layer. Thus, an admittance spectroscopic method is used to study traps in the diode of the Nb-doped TiO2-Au. Two trap levels, located at 0.24 and 0.37 eV below the bottom of the conduction band, have been detected by this method. The state densities and capture cross sections of these trap levels are also determined.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    Oxford, UK : Blackwell Publishing Ltd
    Annals of the New York Academy of Sciences 137 (1966), S. 0 
    ISSN: 1749-6632
    Source: Blackwell Publishing Journal Backfiles 1879-2005
    Topics: Natural Sciences in General
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 23 (1990), S. 526-534 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Following the profile decomposition of CeO2 X-ray powder data into individual structure factors, the maximum-entropy method (MEM) has been used to obtain an electron-density-distribution map. In the profile decomposition process, it is impossible to avoid the problems of overlapping peaks which have the same magnitude of reciprocal vectors, such as d*(511) and d*(333), for a cubic crystal, or very severely overlapping reflections. The formalism to treat such overlapping reflections in the MEM analysis is to introduce combined structure factors. The maximum value of the scattering vector, 4π(sinθ)/λ, which was used in the present analysis is small (about 7.8 Å−1) but the resulting electron-density-distribution map is of a high quality and much superior to the conventional map. As a consequence, the ionic charge of Ce and O ions can be obtained with reasonable accuracy from the MEM density map. Furthermore, the map reveals the existence of electrons around the supposedly vacant site surrounded by eight O atoms, which is probably related to the high ionic conductivity of this substance.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 22 (1989), S. 592-600 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Rod-shaped scattering, referred to as crystal truncation rod (CTR) scattering in X-ray diffraction, can also be observed in optical diffraction patterns obtained from the surface profile image of high-resolution electron micrographs. The characteristics of the CTR scattering are shown to be in agreement with those observed by X-ray scattering. With this technique, information about the lattice relaxation of the image of surfaces or interface boundaries observed in the electron microscope (EM) can be easily obtained and the lattice spacing of a GaAs crystal is shown to be shrunk at the interface boundary between the (001) surface and the amorphous oxide layer. This is precisely opposite to the effect observed for an Si (001) wafer surface. Several effects of surface modulation on CTR scattering are demonstrated using an optical diffractometer and masks of the f.c.c. lattice.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 159-165 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The maximum-entropy method (MEM) is a very powerful method for deriving accurate electron-density distributions from X-ray diffraction data. The success of the method depends on the fact that the electron density is always positive. In order to analyse neutron diffraction data by the MEM, it is necessary to overcome the difficulty of negative scattering lengths for some atoms, such as Ti and Mn. In this work, three approaches to the MEM analysis of neutron powder diffraction data are examined. The data, from rutile (TiO2), have been collected previously and analysed by the Rietveld method [Howard, Sabine & Dickson (1991). Acta Cryst. B47, 462–468]. The first approach is to add an artificial large constant to the scattering-length density to maintain that density positive, then to subtract the same constant at the completion of the MEM analysis. This approach, however, proves unsuccessful since unrealistic density distributions result. In the second approach, the observed structure factors are amended so that the sign of the contribution from the Ti atoms is reversed. This method produces plausible maps of scattering-length density but suffers the disadvantage that the observations must be corrected by a model-dependent calculated factor before the MEM analysis can proceed. The third approach is based not on scattering-length densities but on nuclear densities, which are always positive. Two equations are obtained, one for atoms with nuclei of positive scattering length and the other for atoms with negative scattering length. From these two equations, the nuclear densities of Ti and O atoms can be calculated separately. This procedure, like its X-ray counterpart, requires no structural model. MEM analysis of the rutile data by this approach has been successfully completed. As expected, and in contrast to the electron-density distribution obtained by the MEM [Sakata, Uno, Takata & Mori (1992). Acta Cryst. B48, 591–598], the map shows both Ti and O nuclear densities localized in very small regions around the atomic centres. It is concluded that the MEM applied to neutron powder diffraction data is superior to conventional Fourier transformation and, in spite of the longer computation time, is very well worthwhile.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 26 (1993), S. 453-457 
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: MEED (maximum-entropy electron density) is a program package to calculate the electron-density distribution from a set of structure-factor data by the maximum-entropy method. MEED is an upgraded version of the original maximum-entropy program, MEMTARO, which was used in the first study to use the maximum-entropy method (MEM) on silicon [Sakata & Sato (1990). Acta Cryst. A46, 263–270]. MEED is applicable to any space group and can cope with both single-crystal and powder X-ray diffraction data, whereas MEMTARO can only after modification. Another upgraded feature is the speed of calculation. By employing a new algorithm, MEED is much faster than MEMTARO for the same calculation. Computing time depends on various factors, such as the number of reflection data, accuracy of data and the number of symmetry operations. It is estimated that MEED is typically 100 times faster than MEMTARO. In an extreme case like the beryllium powder-data case, MEED is 600 times faster than MEMTARO. MEED is coded in Fortran77 for both a scaler computer, FACOM M780, and a vector computer, FACOM VP2600, which are mainframe computers at the Computation Center of Nagoya University. MEED enables the electron-density distribution to be calculated for any crystalline material, with a fine pixel size, e.g. with 128 × 128 × 128 pixels to a unit cell, provided that accurate diffraction data are available. MEED can overcome, to some extent, one of the biggest drawbacks of MEM analysis, the vast computing time required.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Chester : International Union of Crystallography (IUCr)
    Journal of synchrotron radiation 5 (1998), S. 977-979 
    ISSN: 1600-5775
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: The endohedral natures of the metallofullerenes Y@C82 and Sc2@C84 are described based on synchrotron radiation powder diffraction experiments. For structural analysis, a combination of the maximum-entropy method (MEM) and Rietveld refinement was employed to analyse the complicated powder pattern. The obtained MEM charge densities show a clear distinction of the endohedral natures of the mono- and dimetallofullerenes.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 51 (1995), S. 47-53 
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: By a recent development of the maximum-entropy method (MEM) following Sakata & Sato [Acta Cryst. (1990), A46, 263–270], electron- (or nuclear-) density distributions have been obtained for crystalline materials of simple structures from single-crystal or powder diffraction data. In order to obtain a ME density map, the ME equation is solved iteratively under the zeroth-order single-pixel approximation (ZSPA) starting from the uniform density. The purpose of this paper is to examine the validity of the ZSPA by using a one-dimensional two-pixel model for which the exact solution can be analytically obtained. For this model, it is also possible to solve the ME equation numerically without ZSPA by the same iterative procedure as in the case of ZSPA. By comparison of these three solutions for a one-dimensional two-pixel model, it is found that the solutions obtained iteratively both with and without ZSPA always converge to the exact solution so long as the value of the Lagrange undetermined multiplier, λ, is chosen to be sufficiently small. This means the ZSPA solution does not depend on λ when the convergence is attained. When, λ exceeds a critical value, iteration with ZSPA gives oscillatory divergence but iteration without ZSPA converges to a different value from the exact solution. It is concluded that the introduction of ZSPA does not cause any serious problem in the solution of the ME equation, when a sufficiently small λ value is used in the ME analysis.
    Type of Medium: Electronic Resource
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