ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We describe the construction and operation of a large-range piezoelectric scanner, suitable for various scanning probe microscopies such as magnetic force, atomic force, and Hall probe microscopies. The instrument is compact and inherently thermally compensated. At room temperature, it has a range of over 2 mm; this range is reduced to 275 μm at 4.2 K. © 1995 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1145652
Permalink