Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
64 (1993), S. 694-699
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
This article describes a new instrument to monitor simultaneously the topography and the contact potential difference between the sample and the tip. This so-called scanning Kelvin microscope has a lateral resolution better than 5 μm. The control of distance between the Kelvin probe and the sample during the scan is realized using the ratio of two harmonics of the measured displacement current. The influence of the geometry of the Kelvin electrode on the time dependence and the frequency spectrum of the displacement current is discussed. Verification of the theory and a linescan across a test sample is shown.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1144200
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