ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new arrayed pinhole camera (APC) diagnostic method for intense ion beams has been developed. The APC diagnostic technique permits the acquisition of the angular divergences and the ion fluxes of high intensity ion beams, in one shot, with a spatial resolution on the source of better than 1 mm and an effective angular divergence resolution of better than 10 mrad. A prototype time integrated APC has been designed and evaluated. The demonstration experiments have been performed on a Reiden-IV, 1 MV and 1 Ω pulsed power machine [1 T W (tera-watt or trillion watts)]. Proton beams of 0.7 MeV, with a pulse duration of ∼50 ns and an ion current density of about 100 A/cm2, were generated in an applied-Br type ion diode source using paraffin-filled grooves. These experimental results show that the APC can measure nonuniformities in the ion beam intensity generated from the ion source and the dependence of beam angular divergence on ion beam intensity. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1146610
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