ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We report the successful design and test of a dispersive extended x-ray absorption fine structure (EXAFS) apparatus at Frascati. This technique is capable of measuring x-ray absorption spectra in fractions of a second and makes time-resolved structural studies possible. We describe the design of the instrument and compare the experimental performance with theoretical predictions. An energy resolution of 2–3×10−4, an energy dispersion ranging from 350 to 870 eV (at 7 to 11 keV), a spot size between 0.5 to 1 mm, and a flux of the order of 106 photons/s/pixel/100 mA was achieved. EXAFS spectra with good signal-to-noise ratio can be obtained in 100 to 600 ms on concentrated samples.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1143771
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