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  • 1
    Electronic Resource
    Electronic Resource
    Electron transport in ZnS (1990)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 1714-1719 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Transport characteristics of N-ZnS are calculated by solving the Boltzmann transport equation using a variational method (including all major scattering mechanisms and screening). The dependence of electron mobility on carrier concentration, for a range of compensation ratio and ionized impurity concentration, are given at both 300 and 77 K. This provides a rapid means for determining material quality. Mobility limits of 230 cm2/V s (n∼1019 cm−3) and over 3000 cm2/V s (n〈1014 cm−3) are calculated at 300 and 77 K, respectively. The temperature dependence of the mobility is calculated and agrees favorably with experimental data.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.346599
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  • 2
    Electronic Resource
    Electronic Resource
    Spectroellipsometric study of sol–gel derived potassium sodium strontium barium niobate films (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 4491-4496 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Spectroscopic ellipsometry (SE) was used to characterize the sol–gel derived (K0.5Na0.5)0.4(Sr0.6Ba0.4)0.8Nb2O6 (KNSBN) thin films as a function of sol concentration. In the analysis of the measured SE spectra, a modified double-layer Forouhi–Bloomer model was adopted to represent the optical properties of the KNSBN films. In this model, the films were assumed to consist of two layers—a bottom bulk KNSBN layer and a surface layer that composed of bulk KNSBN as well as void. Good agreement was obtained between the measured spectra and the model calculations in the chosen spectral region. Effective medium approximation theory was used to evaluate the effective refractive index for the surface layer. The results of SE have been correlated with atomic force microscopy measurements of surface roughness. Our analyses have shown that the surface layer had a lower refractive index than the bottom one. In addition, the refractive index and the surface roughness of the KNSBN films increase with the sol concentration. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1355283
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  • 3
    Electronic Resource
    Electronic Resource
    Nanometer focusing of hard x rays by phase zone plates (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 2238-2241 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Focusing of 8 keV x rays to a spot size of 150 and 90 nm full width at half maximum have been demonstrated at the first- and third-order foci, respectively, of a phase zone plate (PZP). The PZP has a numerical aperture of 1.5 mrad and focusing efficiency of 13% for 8 keV x rays. A flux density gain of 121 000 was obtained at the first-order focus. In this article, the fabrication of the PZP and its experimental characterization are presented and some special applications are discussed. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149744
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  • 4
    Electronic Resource
    Electronic Resource
    Beam size measurement of the stored electron beam at the APS storage ring using pinhole optics : The 9th National conference on synchrotron radiation instrumentation (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3368-3368 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Beam sizes of the stored electron beam at the APS storage ring were measured using pinhole optics and bending magnet x-rays in single-bunch and low-current mode. A white-beam pinhole of 25 μm and a fast x-ray imaging system were located 23.8 m and 35.4 m from the source, respectively. The x-ray imaging system consists of a CdWO4 scintillation crystal 60 μm thick, an optical imaging system, and a CCD detector. A measurement time of a few tenths of a second was obtained on a photon beam of E(approximately-greater-than)30 keV produced from a 7-GeV electron beam of 2-mA current. The resolution of the pinhole imaging system was evaluated to be 16 μm. The measured vertical and horizontal sizes of the electron beam were in reasonable agreement with the expected values. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147370
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  • 5
    Electronic Resource
    Electronic Resource
    Design of a dedicated beamline for x-ray microfocusing- and coherence-based techniques at the Advanced Photon Source : The 9th National conference on synchrotron radiation instrumentation (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3373-3373 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A dedicated insertion-device beamline has been designed and is being constructed at the Advanced Photon Source (APS) for development of x-ray microfocusing- and coherence-based techniques and applications. Important parameters considered in this design include preservation of source brilliance and coherence, selectable transverse coherence length and energy bandwidth, high beam angular stability, high order harmonic suppression, quick x-ray energy scan, and accurate and stable x-ray energy. The overall design of this beamline layout and the major beamline components are described. The use of a horizontally deflecting mirror as the first optical component is one of the main features of this beamline design, and the resulting advantages are briefly discussed. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147340
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  • 6
    Electronic Resource
    Electronic Resource
    Fabrication of mm-wave undulator cavities using deep x-ray lithography : The 9th National conference on synchrotron radiation instrumentation (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3348-3348 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The possibility of fabricating mm-wave radio frequency cavities (100–300 GHz) using deep x-ray lithography (DXRL) is being investigated. The fabrication process includes manufacture of precision x-ray masks, exposure of positive resist by x-ray through the mask, resist development, and electroforming of the final microstructure. Highly precise, two-dimensional features can be machined onto wafers using DXRL. Major challenges are: fabrication of the wafers into three-dimensional rf structures; alignment and overlay accuracy of structures; adhesion of the PMMA on the copper substrate; and selection of a developer to obtain high resolution. Rectangular cavity geometry is best suited to this fabrication technique. A 30- or 84-cell 108-GHz mm-wave structure can serve as an electromagnetic undulator. A mm-wave undulator, which will be discussed later, may have special features compared to the conventional undulator. First harmonic undulator radiation at 5.2 keV would be possible using the Advanced Photon Source (APS) linac system, which provides a low-emittance electron beam by using an rf thermionic gun with an energy as high as 750 MeV. More detailed rf simulation, heat extraction analysis, beam dynamics using a mm-wave structure, and measurements on 10x larger scale models can be found in these proceedings [Y.W. Kang et al., "Design and Construction of Planar mm-wave Accelerating Cavity Structures''] © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147497
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  • 7
    Electronic Resource
    Electronic Resource
    APS undulator radiation—first results : The 9th National conference on synchrotron radiation instrumentation (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3348-3348 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The first undulator radiation has been extracted from the Advanced Photon Source (APS). The results from the characterization of this radiation are very satisfactory. With the undulator set at a gap of 15.8 mm (K=1.61), harmonics as high as the 17th were observed using a crystal spectrometer. The angular distribution of the third-harmonic radiation was measured, and the source was imaged using a zone plate to determine the particle beam emittance. The horizontal beam emittance was found to be 6.9±1.0 nm-rad, and the vertical emittance coupling was found to be less than 3%. The absolute spectral flux was measured over a wide range of photon energies, and it agrees remarkably well with the theoretical calculations based on the measured undulator magnetic field profile and the measured beam emittance. These results indicate that both the emittance of the electron beam and the undulator magnetic field quality exceed the original specifications. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147262
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  • 8
    Electronic Resource
    Electronic Resource
    Advantages of using a mirror as the first optical component for APS undulator beamlines : The 9th National conference on synchrotron radiation instrumentation (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3353-3354 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The advantages of using a mirror as the first optical component for an Advanced Photon Source (APS) undulator beamline for thermal management, radiation shielding mitigation, and harmonic rejection are presented. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147398
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  • 9
    Electronic Resource
    Electronic Resource
    Development of a hard x-ray imaging microscope : Proceedings of the 5th international conference on synchrotron radiation instrumentation (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 2287-2289 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A hard x-ray imaging microscope based on a phase zone plate has been developed and tested. The zone plate, with a 5 cm focal length and a 0.2 μm smallest linewidth, was used to image 8 keV x rays from the samples. The imaging microscope can be used to obtain nearly diffraction-limited resolution over the entire imaging field, and its resolution is almost independent of source size and source motions. We have tested such an imaging microscope, and a resolution of about 0.4 μm was obtained. The images were obtained with an exposure time of less than 1 min, for a magnification factor of 30 in the x rays. The x rays were then converted into visible light, and another 7 times magnification were obtained by using a lens system coupled to a charge coupled device camera. The results from the imaging microscope, and possible applications, will be discussed. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145666
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  • 10
    Electronic Resource
    Electronic Resource
    Integration of a hard x-ray microprobe with a diffractometer for microdiffraction : Papers from the 12th National Synchrotron Radiation Instrumentation Conference (2002)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 73 (2002), S. 1506-1508 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A hard x-ray Fresnel zone-plate-based microprobe has been designed and integrated into a Newport kappa diffractometer for microdiffraction studies at the 2ID-D beamline at the Advance Photon Source. The microprobe employs 10 and 40 cm (focal length at 8 keV) zone plates to provide high and moderate focusing power, respectively. Each zone-plate assembly has two identical zone plates stacked together to provide higher focusing efficiency for higher energy (30 keV) applications. The mounting base of the microprobe is supported by the side of the base of the diffractometer at one end and the central table of the diffractometer at the other end, thus minimizing the instability of relative positions between the focal spot and the specimen. A x-ray focal spot size smaller than 360 nm and angular repeatability of the sample circles smaller than 0.001° have been demonstrated with this setup. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1435815
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