Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
75 (1999), S. 2377-2379
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
We show that a photoelectron spectromicroscope of the photoelectron emission microscope type can be used as an x-ray imaging detector for radiology. Using high penetration hard-x-ray photons (wavelength 〈0.1 nm), samples as thick as a few millimeters can be imaged with submicron resolution. The high imaging resolution enables us to substantially decrease the object-detector distance needed to observe coherent based contrast enhancement with respect to the standard film-based detection technique. Our result implies several advantages, the most important being a marked reduction of the required source emittance for contrast enhanced radiology. © 1999 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.125020
Permalink
|
Location |
Call Number |
Expected |
Availability |