ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
We describe a picosecond resolution time-resolved photoluminescence microscope with high detection sensitivity at wavelengths extending beyond 1500 nm. The instrument performs time-correlated single photon counting using an InGaAs/InP single photon avalanche diode as a detector, and provides temporal resolution of less than 300 ps (full width at half maximum) and spatial resolution down to 4 μm at a sample temperature between 4 and 300 K. Analysis of noise characteristics indicates the ability to measure the excess carrier lifetimes of semiconductor devices with excited carrier densities of less than 1014 cm−3. © 2001 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1366635
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