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  • 1
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 74 (1993), S. 249-254 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Period expansion after annealing in tungsten/carbon (W/C) multilayer films has been observed by several authors. Although most results have emphasized that the carbon layers play the important role in such thermal evolution, it is important to clarify the structure of the carbon atoms in those multilayers both before and after annealing in order to explain such period expansion more clearly. In this paper, Raman scattering is carried out on the W/C multilayers fabricated by various methods, all of which showed different period expansion values ranging from 0% to 20%. We show that the initial carbon in those multilayers becomes graphitized differently depending on the fabrication methods. The carbon fabricated by rf sputtering under a reactive gas has the highest amount of graphite component as compared with those prepared under a pure argon gas atmosphere. After annealing at 1000 °C, graphitization can be observed, but there are no obvious structural differences for the carbon in all the annealed W/C multilayer films. Such graphitization of the carbon layer causes a decrease in its density, and thus an increase in its thickness. Due to the different initial states of the carbon in the multilayers produced by the different methods and to the identical final state after annealing, the different carbon layer thickness expansions are expected and do agree with the small angle x-ray diffraction measurements.
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 931-937 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A series of W/C multilayers has been fabricated using a magnetron sputtering device. In order to establish comparison with other multilayers produced by several laboratories, their atomic structure and thermal evolution has been studied by small- and wide-angle x-ray scattering, respectively, and Raman spectroscopy. By plotting the nominal thickness determined by the sputtering speed versus the thickness obtained by simulation of small-angle x-ray scattering spectra the existence has been confirmed of a WC interface compound of about 0.7 nm formed during the multilayer deposition. The multilayers fabricated by the magnetron sputtering device showed higher thermal stability and less period expansion than those produced by different apparatus [Dupuis et al., J. Appl. Phys. 68, 5146 (1990), Jiang et al., J. Appl. Phys. 65, 196 (1989)]. Raman spectra indicated that the carbon in the W/C multilayers is more graphitized than in the previous W/C multilayer. The carbon is further graphitized after annealing at 1000 °C. The graphitization of carbon induced its density to decrease, that is, thickness to increase. Consequently, in the multilayers a smaller expansion of carbon is expected after annealing at 1000 °C since there is more graphitized carbon in the initial as-deposited state than in the previous W/C multilayer. This conclusion agrees very well with the thickness variation measured by x-ray diffraction.
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 3348-3355 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Multilayers consisting of alternating thin bilayers of W and Si (period: 1.5〈d〈9 nm) have been analyzed by x-ray scattering (absolute reflectivity, period, mosaicity, interface roughness, crystallinity, and density) and by cross-sectional transmission electron microscopy observations (periodicity, crystalline phase, and damaged area). Our purpose was to determine the thermal properties of the multilayers with respect to the period value under pulsed laser heating (with a nanosecond Nd-YAG laser at different energy densities up to 1 J/cm2 and at a wavelength λ=0.53 μm) and by furnace annealing (250〈T〈1000 °C under 10−7 Torr pressure). We propose that two distinct diffusion mechanisms are involved in annealings: first, interdiffusion in the amorphous phase and then crystallization into WSi2, the latter related to a period contraction of about 5–10%. The diffusion coefficients and the crystallization temperature depend drastically on the period value. Simulations of small-angle x-ray scattering curves take well into account this thermal evolution. Extinctions and modulations of the intensities of the Bragg peaks are well fitted by thickness and roughness variations.
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 68 (1990), S. 5146-5154 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The thermal behavior of X/C multilayers (nanometer-thick layers made of tungsten, nickel, or SiWSi alternating with carbide or pure carbon) was studied. Two types of annealing were performed: the pulsed laser annealing in air and the classical thermal annealing in a vacuum furnace. Depending on the composition and the structure of the layered materials, thermal stability or diffusion mechanisms were observed and further analyzed by small-angle x-ray scattering, transmission electron microscopy, and Auger electron spectroscopy. The results show that the period expansion and the reflectivity evolution, that were observed in some cases after treatment, are caused both by structural changes into the layers and by exchange of matter between layers. These changes always induce a partial graphitization of the amorphous carbon and, in the case of W/C multilayers, the formation of a W2C compound.
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 3472-3477 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We present an x-ray detector with a high sensitivity in the 1–20 MeV x-ray range. This device consists of a scintillator coupled with a microchannel plate image intensifier tube working in the visible range. The performance of the hard-x-ray detector is described. The modulation transfer function, the characteristic curve, and the detection threshold were measured. Using an x-ray flash generator in the 4 MeV x-ray range, we have been able to record images of dense spheres for dose levels as low as 1.5 μGray. Similar experiments have been realized with a linear accelerator for different x-ray spectra (10 and 20 MeV). Our results demonstrate that this device works in a range where the most sensitive intensifying screens and films, usually used on flash radiography, are inoperative. © 1996 American Institute of Physics.
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  • 6
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Clusters of iron, cobalt, and nickel are produced in a laser vaporization source. The size distributions of the incident clusters are checked by time-of-flight mass spectrometry before deposition at low energy. Studying the near threshold photoionization, Con and Nin clusters exhibit an icosahedral structure while for iron, no clear structure emerges. Neutral clusters were deposited on different substrates at room temperature with thicknesses up to 100 nm in view to determine their structure and magnetic properties. A limited coalescence of the clusters is observed from high-resolution transmission electron microscopy. No icosahedron has been observed but cuboctahedron and interface twins between adjacent particles have been clearly identified in Ni films. Grazing incidence x-ray diffraction experiments reveal a classical phase with grain size around 6 and 4 nm for Fe and Ni films, respectively but an anomalous fcc phase for Co films and a very low grain size of 2 nm. The density of films determined by x-ray reflectivity was estimated to represent only 60%–65% of the bulk density. Magnetic behaviors studied by ferromagnetic resonance and SQUID magnetization measurements have been interpreted using the correlated spin glass model. Mössbauer spectra performed on Fe films at zero field revealed the presence of 20% of iron in the form of thin nonmagnetic oxide skin surrounding Fe grains which allow to find 2.2 μB per magnetic iron atom in agreement with macroscopic magnetic measurements. Nevertheless we found an anomalous reduced atomic moment for Ni film.
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 7192-7195 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Presented is a novel high sensitivity magnetometer allowing us to measure the magnetization reversal of about 104 μB corresponding to a sensitivity of about 10−16 emu. The detector is a niobium micro-bridge DC superconducting quantum interference device (SQUID), fabricated using electron-beam lithography. It is operational in the temperature range of 0–7 K. Furthermore, we present a method to deposit on the SQUID loop a small number of Co clusters of about 2–5 nm in diameter. The first results obtained on these samples show that there is still a ferromagnetic coupling between the clusters and the magnetization reversal takes place by small avalanches. © 1995 American Institute of Physics.
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  • 8
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 108 (1998), S. 4607-4613 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: Distributions of neutral Si-clusters centered around mean sizes of 50 and 200 atoms have been produced using a laser vaporization source and deposited on various substrates at room temperature in ultrahigh vacuum. The Si-cluster assembled films obtained, resulting from the random stacking of incident free nanosize clusters, were subsequently coated by appropriate protective layers before removing in air to perform ex situ infrared, visible, Raman, and photoluminescence spectrometry measurements, as well as transmission electron microscopy observations. The main characteristics of the cluster films are comparable to those observed for amorphous hydrogenated silicon and quite different to those of conventional nanoporous structures or clusters larger than 2–3 nm. The observed intense photoluminescence signal and band gap suggest the presence of a low number of dangling bonds probably due to surface reconstruction effects, connections between adjacent clusters, and oxygen contamination. As for the oxygen contamination, infrared and x-ray photoemission spectrometry measurements agree with the assumption of oxygen atoms trapped at the cluster surface. Finally, all the results on the vibrational and optical properties tend to confirm the failure of the classical confinement model in a diamond lattice to explain the behavior of such nanostructured materials with grain size typically in the nanometer range. The presence of five-membered rings characteristic of the Si-cluster structures in this size range with the subsequent rehybridization effects, as well as the connection process between adjacent clusters seem to be a track which is discussed for a better interpretation of the results. © 1998 American Institute of Physics.
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  • 9
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Solid State Communications 57 (1986), S. 711-712 
    ISSN: 0038-1098
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 10
    ISSN: 0009-2614
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
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