ISSN:
1600-5767
Source:
Crystallography Journals Online : IUCR Backfile Archive 1948-2001
Topics:
Geosciences
,
Physics
Notes:
Rietveld refinements of corundum, a rutile and anatase nanocrystalline synthetic mixture, and gypsum, on laboratory energy dispersive X-ray diffraction (EDXD) data are reported. Cell parameters, positional and displacement parameters are in reasonable agreement with single-crystal reference data, despite the rather poor resolution of EDXD data. In particular, good results were obtained for gypsum (unrestrained refinement) with counting times as short as 1000 s.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1107/S0021889801014728
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