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  • 1
    Call number: ZSP-201-83/21
    In: CRREL Report, 83-21
    Description / Table of Contents: The probability density function of the gouge depths into the sediment is represented by a simple negative exponential over four decades of gouge frequency. The exceedance probability function is, therefore, e to the -lambda d, where d is the gouge depth in meters and lambda is a constant. The value of lambda shows a general decrease with increasing water depth, from 9/m in shallow water to less than 3/m in water 30 to 35 m deep. The deepest gouge observed was 3.6 m, from a sample of 20,354 gouges that have depths greater than or equal to 0.2 m. The dominant gouge orientations are usually unimodal and reasonably clustered, with the most frequent alignments roughly parallel to the general trend to the coastline. The value of N(bar) sub 1, the mean number of gouges (deeper than 0.2 m) per kilometer measured normal to the trend of the gouges, varies from 0.2 for protected lagoons to 80 in water between 20 and 38 m deep in unprotected offshore regions. The distribution of the spacings between gouges as measured along a sampling track is a negative exponential. The form of the frequency distribution of N sub 1 varies with water depth and is exponential for lagoons and shallow offshore areas, previously skewed for 10 to 20 m depths off the barrier islands, and near-normal for deeper water. As a Poisson distribution gives a reasonable fit to the N sub 1 distributions for all water depths, it is suggested that gouging can be taken as approximating a Poisson process in both space and time. The distributions of the largest values per kilometer of gouge depths, gouge widths, and the heights of the lateral embankment of sediments plowed from the gouges are also investigated.
    Type of Medium: Series available for loan
    Pages: 40 Seiten , Illustrationen, 1 Karte
    Series Statement: CRREL Report 83-21
    Language: English
    Note: CONTENTS Abstract Preface Introduction Background and environmental setting Data collection and terminology Data analysis Gouge depths Gouge orientation Gouge frequency Extreme value analysis Applications to offshore design Gouge depth Extreme value statistics Burial depths Conclusion Literature cited Appendix A: Detailed bathymetric map of the Alaskan portion of the Beaufort Sea
    Location: AWI Archive
    Branch Library: AWI Library
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  • 2
    Publication Date: 2019-07-17
    Repository Name: EPIC Alfred Wegener Institut
    Type: Article , isiRev
    Format: application/pdf
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  • 3
    Publication Date: 2022-03-29
    Description: Although submarine landslides have been studied for decades, a persistent challenge is the integration of diverse geoscientific datasets to characterize failure processes. We present a core‐log‐seismic integration study of the Tuaheni Landslide Complex to investigate intact sediments beneath the undeformed seafloor as well as post‐failure landslide deposits. Beneath the undeformed seafloor are coherent reflections underlain by a weakly‐reflective and chaotic seismic unit. This chaotic unit is characterized by variable shear strength that correlates with density fluctuations. The basal shear zone of the Tuaheni landslide likely exploited one (or more) of the low shear strength intervals. Within the landslide deposits is a widespread “Intra‐debris Reflector”, previously interpreted as the landslide's basal shear zone. This reflector is a subtle impedance drop around the boundary between upper and lower landslide units. However, there is no pronounced shear strength change across this horizon. Rather, there is a pronounced reduction in shear strength ∼10–15 m above the Intra‐debris Reflector that presumably represents an induced weak layer that developed during failure. Free gas accumulates beneath some regions of the landslide and is widespread deeper in the sedimentary sequence, suggesting that free gas may have played a role in pre‐conditioning the slope to failure. Additional pre‐conditioning or failure triggers could have been seismic shaking and associated transient fluid pressure. Our study underscores the importance of detailed core‐log‐seismic integration approaches for investigating basal shear zone development in submarine landslides.
    Description: Plain Language Summary: Submarine landslides move enormous amounts of sediment across the seafloor and have the potential to generate damaging tsunamis. To understand how submarine landslides develop, we need to be able to image and sample beneath the seafloor in regions where landslides have occurred. To image beneath the seafloor we generate sound waves in the ocean and record reflections from those waves, enabling us to produce “seismic images” of sediment layers and structures beneath the seafloor. We then use scientific drilling to sample the sediment layers and measure physical properties. In this study, we combine seismic images and drilling results to investigate a submarine landslide east of New Zealand's North Island. Drilling next to the landslide revealed a ∼25 m‐thick layer of sediment (from ∼75–95 m below the seafloor) that has strong variations in sediment strength and density. We infer that intervals of relatively low strength within this layer developed into the main sliding surface of the landslide. Additionally, results from within the landslide suggest that the process of landslide emplacement has induced a zone of weak sediments closer to the seafloor. Our study demonstrates how combining seismic images and drilling data helps to understand submarine landslide processes.
    Description: Key Points: We integrate scientific drilling data with seismic reflection data to investigate the submarine Tuaheni Landslide Complex. Basal shear zone of the landslide likely exploited a relatively low shear strength interval within an older (buried) mass transport deposit. Landslide emplacement seems to have induced an additional weak zone that is shallower than the interpreted base of the landslide deposit.
    Description: Marsden Fund (Royal Society of New Zealand Marsden Fund) http://dx.doi.org/10.13039/501100009193
    Description: European Consortium for Ocean Research Drilling
    Description: International Ocean Drilling Program, Science Support Program
    Description: New Zealand Ministry for Business Innovation and Employment
    Description: Deutsche Forschungsgemeinschaft (DFG) http://dx.doi.org/10.13039/501100001659
    Description: https://doi.pangaea.de/10.1594/PANGAEA.928073
    Keywords: ddc:622.15 ; ddc:551
    Language: English
    Type: doc-type:article
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  • 4
    Electronic Resource
    Electronic Resource
    s.l. : American Chemical Society
    Analytical chemistry 66 (1994), S. 2226-2231 
    ISSN: 1520-6882
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Photoluminescence excitation (PLE) spectra at photon energies near the indirect band gap of diamond have been obtained for diamond films grown by the filament-assisted chemical vapor deposition (CVD) method. The PLE intensity was observed to increase abruptly with photon energy above 5.5 eV. This increase coincides with the onset of phonon-emission-assisted interband absorption, which was observed independently by diffuse transmittance measurements. A lower-energy PLE threshold at ∼5.25 eV, which coincides approximately with the onset of phonon-absorption-assisted interband absorption, was observed in the spectrum of a gem-quality natural diamond, but not in the spectra of the CVD-grown films. Emission spectra of the luminescence excited by above-band-gap photons have features similar to luminescence spectra of the same specimens excited by 20-keV electrons. The spectrally integrated intensities of the luminescence excited by above-band-gap photons and by electrons were found to vary from specimen to specimen in a linearly related manner, suggesting that similar recombination processes occur in both cases.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 70 (1991), S. 739-743 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using the technique of deep-level transient spectroscopy (DLTS), we have studied the formation of the defects in the near-surface region of n-GaAs implanted with different doses of 2.0-MeV 16O+ ions. Our results show that EL6 and the U band are the principal defect centers in room-temperature-implanted samples. In the case of samples implanted at 200 °C, DLTS results also show the presence of hole levels in addition to the EL6 and the U band. When the samples were subjected to rapid thermal annealing after room-temperature ion implantation, hole traps were the major defect centers in the near-surface region. Just below the surface region, however, limited recovery has occurred as shown by the re-emergence of electron traps. However, the defect structure is still different from that of the unimplanted samples. These results can be used to show the extent of lattice recovery after rapid thermal annealing. A mechanism is proposed to explain the evolution of the defects in MeV ion implanted n-GaAs.
    Type of Medium: Electronic Resource
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  • 7
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We explore the different contact resistances obtained by using a one, two, and three band Wentzel-Kramers-Brillouin (WKB) calculation of the tunneling probability for majority carriers in an ohmic contact to n-type GaAs. The depletion approximation is used resulting in a parabolic potential. Finally, the calculations are repeated using a numerical solution to the wave equation in the depletion region of the semiconductor instead of employing WKB. It will be seen that the WKB approximation leads to contact resistances that are approximately twice as large as those numerically calculated from the wave equation.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    College Park, Md. : American Institute of Physics (AIP)
    The Journal of Chemical Physics 93 (1990), S. 3573-3579 
    ISSN: 1089-7690
    Source: AIP Digital Archive
    Topics: Physics , Chemistry and Pharmacology
    Notes: The problem of deriving realistic interaction potentials for modeling hydrated sites within aluminosilicate structures has been considered. It is argued that since a variety of cationic sites is involved, the effect of the lattice must be taken into account explicitly, both in the derivation and in the use of H2O–cation potentials. A new method for doing this is described with examples for H2O–Si4+ and H2O–Al3+ in quartz and/or zeolite-A. A more detailed analysis for H2O–Ca2+ in zeolite-A and cement structures is presented.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 53 (1988), S. 1940-1942 
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The presence of deep levels in several samples of InP metal-insulator-semiconductor (MIS) structures was studied using the deep level transient spectroscopy technique. The InP MIS structures were fabricated using three different methods of oxide formation, two of which are chemical oxides and the third is plasma-grown oxide. Defect levels ranging from (Ec−0.22) to (Ec−0.6) eV were observed in the samples. However, the levels at about (Ec−0.22) and (Ec−0.35) eV were detected only after increasing the reverse-bias voltage to −2 V at a temperature of about 390 K. This phenomenon occurred in all the samples studied, irrespective of the method of oxidation. The appearance of the peaks corresponding to the shallower traps is irreversible and may explain the performance instability commonly encountered in InP MIS-based devices.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 579-580 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The use of the Lamb dip as a technique for precision spectroscopy in a non-neutral plasma is explored through computer modeling. Using singly ionized magnesium as the ion and under typical pure ion plasma conditions, the measurement appears to be feasible. Under the conditions calculated here, the Lamb dip is only 4% wider than the natural linewidth of the transition.
    Type of Medium: Electronic Resource
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