ISSN:
1349-9432
Keywords:
solid immersion lens
;
submicron resolution imaging
;
nano-scale quantum wells
;
near-field optics
;
spherical aberration
;
spatial resolution
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract We have discussed the resolution of submicron photoluminescence (PL) imaging using a solid immersion lens (SIL), which collects an evanescent light field. We apply the SIL microscope to measure PL image of a strip-line-patterned GaAs quantum well structure at low temperature. An improved resolution beyond diffraction limit and high collection efficiency of PL are realized.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s10043-999-0257-3
Permalink