ISSN:
1573-0727
Keywords:
analog circuits
;
fault dictionary
;
test nodes
Source:
Springer Online Journal Archives 1860-2000
Topics:
Electrical Engineering, Measurement and Control Technology
Notes:
Abstract A method is proposed to obtain a minimal set of test nodes of an analog circuit for isolating all faulty conditions in the fault dictionary approach. Relevant theorem along with the proof is also given. Proposed method is extremely fast. This method is illustrated with an active filter circuit example.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00995317
Permalink