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  • 1
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    The donor nature of muonium in undoped, heavily n-type and p-type InAs (2009)
    Institute of Physics
    Details
    Publication Date: 2009-01-29
    Print ISSN: 0953-8984
    Electronic ISSN: 1361-648X
    Topics: Physics
    Published by Institute of Physics
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    PAPER CURRENT
  • 2
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    Particle fluxes of PC038_88/90_trap (2003)
    PANGAEA
    Details
    Publication Date: 2023-02-12
    Keywords: Calculated; Calculated, see reference(s); Carbon, inorganic, particulate, flux; Carbon, organic, particulate, flux; DEPTH, water; Duration, number of days; Lithogenic, flux; Opal, flux; PC038; PC038_88/90_trap; Total, flux per year; Trap, sediment; TRAPS
    Type: Dataset
    Format: text/tab-separated-values, 6 data points
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    DATA PANGAEA
  • 3
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    Particle fluxes of PC038_90/92_trap (2003)
    PANGAEA
    Details
    Publication Date: 2023-02-12
    Keywords: Calculated; Calculated, see reference(s); Carbon, inorganic, particulate, flux; Carbon, organic, particulate, flux; DEPTH, water; Duration, number of days; Lithogenic, flux; Opal, flux; PC038; PC038_90/92_trap; Total, flux per year; Trap, sediment; TRAPS
    Type: Dataset
    Format: text/tab-separated-values, 12 data points
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    DATA PANGAEA
  • 4
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    Particle fluxes of GC017_trap (2003)
    PANGAEA
    Details
    Publication Date: 2023-02-12
    Keywords: Calculated; Calculated, see reference(s); Carbon, inorganic, particulate, flux; Carbon, organic, particulate, flux; DEPTH, water; Duration, number of days; GC017; GC017_trap; Lithogenic, flux; Opal, flux; Total, flux per year; Trap, sediment; TRAPS
    Type: Dataset
    Format: text/tab-separated-values, 6 data points
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    DATA PANGAEA
  • 5
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    Particle fluxes of PC041_trap (2003)
    PANGAEA
    Details
    Publication Date: 2023-02-12
    Keywords: Calculated; Calculated, see reference(s); Carbon, inorganic, particulate, flux; Carbon, organic, particulate, flux; DEPTH, water; Duration, number of days; Lithogenic, flux; Opal, flux; PC041; PC041_trap; Total, flux per year; Trap, sediment; TRAPS
    Type: Dataset
    Format: text/tab-separated-values, 12 data points
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    DATA PANGAEA
  • 6
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    Biogenic opal, carbonate fluxes, time series (1995)
    PANGAEA
    In:  Supplement to: Deuser, Werner G; Jickells, Timothy D; King, P; Commeau, J A (1995): Decadal and annual changes in biogenic opal and carbonate fluxes to the deep Sargasso Sea. Deep Sea Research Part I: Oceanographic Research Papers, 42(11-12), 1923-1932, https://doi.org/10.1016/0967-0637(95)00093-3
    Details
    Publication Date: 2024-02-01
    Description: Analyses of samples from a 14-year series of sediment-trap deployments in the deep Sargasso Sea reveal a significant trend in the ratio of the sinking fluxes of biogenic calcium carbonate and silica. Although there are pronounced seasonal cycles for both flux components, the overall opal/CaCO3 ratio changed by 50% from 1978 to 1991 (largely due to a decrease of opal flux), while total flux had no significant trend. These results suggest that plankton communities respond rapidly to subtle climate change, such as is evident in regional variations of wind speed, precipitation, wintertime ventilation and midwater temperatures. If the trends we observe in the makeup of sinking particulate matter occur on a large scale, they may in turn modify climate by modulating ocean-atmosphere CO2 exchange and albedo over the ocean.
    Keywords: BATS; Calcium carbonate, flux; compiled data; DATE/TIME; DEPTH, water; Duration, number of days; JGOFS; Joint Global Ocean Flux Study; MOOR; Mooring; Opal, flux; Sargasso Sea; see reference(s); Silicon Cycling in the World Ocean; SINOPS; Total mass, flux per day
    Type: Dataset
    Format: text/tab-separated-values, 328 data points
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    DATA PANGAEA
  • 7
    Electronic Resource
    Electronic Resource
    Passivity in the Iron-Chromium Binary Alloys (1959)
    s.l. : American Chemical Society
    The @journal of physical chemistry 〈Washington, DC〉 63 (1959), S. 2026-2032 
    Details
    Source: ACS Legacy Archives
    Topics: Chemistry and Pharmacology , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1021/j150582a012
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    Paper (German National Licenses)
    Fulltext
  • 8
    Electronic Resource
    Electronic Resource
    Dislocation imaging using transmission ion channeling (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 2640-2653 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Interface dislocations present in a Si0.85Ge0.15/Si sample have been imaged using the channeling scanning transmission ion microscopy (CSTIM) method with a 2 MeV proton beam 200 nm across. Groups of parallel dislocations gave dark bands of contrast down to ∼1.5 μm across, the contrast arising from dechanneling of the beam by the bent lattice planes. Tilting of the sample caused the band contrast to change and gave quantitative data concerning the local bending of the lattice planes. A low-angle boundary model was developed to describe the effect of the groups of dislocations on the channeling contrast. Channeling and topography contrast were obtained from mesa structures present on the sample. Improvements in the sensitivity of the CSTIM method are discussed. The dislocations in the sample were initially characterized by transmission electron microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353081
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  • 9
    Electronic Resource
    Electronic Resource
    Microcircuit imaging using an ion-beam-induced charge (1992)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 72 (1992), S. 2097-2104 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Ionizing radiation such as photons, keV electrons, or MeV ions can generate electron-hole pairs in semiconducting material. The high penetrating power of MeV light ions allows them to generate electron-hole pairs from deep within intact microelectronic devices, so images can be formed of the device active areas with very little degradation of the spatial resolution of the focused MeV ion beam. Furthermore, the ion-beam-induced charge (IBIC) image contrast is not strongly affected by the energy loss through the overlying device layers. This article is the first to demonstrate the capability of a nuclear microprobe to generate IBIC images of the active regions of devices through the passivation and metallization layers. The effect of the carrier generation volume on IBIC resolution is assessed. The ability of IBIC to align the major crystal axes of semiconductor samples is shown, and the effect of ion-induced damage on IBIC image contrast is considered.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.351596
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  • 10
    Electronic Resource
    Electronic Resource
    Control of noisy chaotic motion in a system with nonlinear excitation and restoring forces (1997)
    Woodbury, NY : American Institute of Physics (AIP)
    Chaos 7 (1997), S. 290-300 
    Details
    ISSN: 1089-7682
    Source: AIP Digital Archive
    Topics: Physics
    Notes: In this study we examine the complex and chaotic oscillations of a dynamical system with nonlinear excitation and restoring forces for the purpose of controlling these oscillatory states. The physical system, modeled as a system of first-order nonlinear ordinary differential equations, takes into account a geometric nonlinearity in the restoring force, a quadratic viscous drag, and a harmonic excitation force. It is controlled using small perturbations about a selected unstable cycle and control is instigated for periodic cycles of varying periodicities. The controller, when applied on the dynamical system with additive random noise in the excitation, successfully controls the system with noise levels in excess of 5% of the total energy, giving the first evidence that (stochastic) control of these systems is possible. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.166228
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    Paper (German National Licenses)
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