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  • 1
    Electronic Resource
    Electronic Resource
    Interface structure of CdSe/ZnSe epilayers (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 3818-3822 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Interface microstructure and strain relaxation of atomic-layer-epitaxy-grown CdSe on ZnSe/GaAs〈001〉 was investigated by using transmission electron microscopy and high-resolution transmission electron microscopy techniques. The CdSe epilayer is characterized with fluctuated misorientations along the interface, irregularly distributed stacking faults (SFs), and an array of misfit dislocations (MDs) composed of 60°, Lomer, and partial types. It is found that the fluctuated misorientation is related to the proportion of different 60° MDs and SFs, and this causes the local strain difference. The analysis of MDs is facilitated by using a digital image processing method and allows a clear image of a Lomer MD formed by interaction of two 60° MDs as well as the value of remaining local strains by measuring the density of MDs. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358557
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  • 2
    Electronic Resource
    Electronic Resource
    Image resolution enhancement by combining information from electron diffraction pattern and micrograph
    Amsterdam : Elsevier
    Ultramicroscopy 36 (1991), S. 361-365 
    Details
    ISSN: 0304-3991
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Electrical Engineering, Measurement and Control Technology , Natural Sciences in General , Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0304-3991(91)90127-R
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  • 3
    Electronic Resource
    Electronic Resource
    A remark on H1 mappings (1986)
    Springer
    Manuscripta mathematica 56 (1986), S. 1-10 
    Details
    ISSN: 1432-1785
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Abstract With $$\mathbb{B} = \left\{ {\varepsilon \mathbb{R}^3 :\left| x \right|〈 1} \right\}$$ , we here construct, for each positive integer N, a smooth function $$g : \partial \mathbb{B} \to \mathbb{S}^2 $$ of degree zero so that there must be at least N singular points for any map that minimizes the energy $$\varepsilon \left( u \right) = \int\limits_\mathbb{B} {\left| {\nabla u} \right|} ^2 dx$$ in the family $$U\left( g \right) : \left\{ {u\varepsilon H^1 \left( {\mathbb{B},\mathbb{S}^2 } \right) : u\left| {\partial \mathbb{B} = g} \right|} \right\}$$ . The infimum of ε over U(g) is strictly smaller than the infimum of ε over the continuous functions in U(g). There are some generalizations to higher dimensions.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01171029
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  • 4
    Electronic Resource
    Electronic Resource
    Plateau's problem for H-convex curves (1987)
    Springer
    Manuscripta mathematica 58 (1987), S. 497-511 
    Details
    ISSN: 1432-1785
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Abstract Various uniqueness results and non-uniqueness results for minimal surfaces are derived together with applications to boundary estimates and to finiteness theorems.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01277607
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  • 5
    Electronic Resource
    Electronic Resource
    Image processing in high-resolution electron microscopy using the direct method. II. Image deconvolution (1986)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 42 (1986), S. 353-356 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A new method is proposed to estimate the defocus (Δf) from a single electron micrograph (EM). The method has been tested by simulations using theoretical EM's calculated under different defocus conditions. The preliminary method is successful except when the EM is taken near the optimum defocus. This can be improved by making use of the information from the electron diffraction pattern. The method will be effective for radiation-sensitive materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767386099129
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  • 6
    Electronic Resource
    Electronic Resource
    Variational problems with free interfaces (1993)
    Springer
    Calculus of variations and partial differential equations 1 (1993), S. 149-168 
    Details
    ISSN: 1432-0835
    Keywords: 49A21 ; 35A15
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Summary A large class of problems arise in the material sciences involving free interfaces. To establish the existence and regularity (including the regularity of free interfaces) of solutions has been an important and interesting issue. Here we were able to do so in a model case accounted in optimal designs. The method developed in this paper is rather general and may be useful for many other related problems.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01191615
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  • 7
    Electronic Resource
    Electronic Resource
    Image processing in high-resolution electron microscopy using the direct method.I.Phase extension (1985)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 41 (1985), S. 163-165 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A procedure to combine the information from an electron micrograph (EM) and the corresponding electron diffraction (ED) pattern is proposed. Here the ED data will be used to obtain a set of amplitudes of the structure factors, while the EM will be used to obtain a set of starting phases assuming the weak-phase-object approximation. A direct method is then used to extend the phase information from a resolution of about 2 to 1 Å. The efficiency of the procedure has been verified by the test calculation on the model structure of copper perchlorophthalocyanine.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767385000320
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  • 8
    Electronic Resource
    Electronic Resource
    Existence and partial regularity of static liquid crystal configurations (1986)
    Springer
    Communications in mathematical physics 105 (1986), S. 547-570 
    Details
    ISSN: 1432-0916
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics , Physics
    Notes: Abstract We establish the existence and partial regularity for solutions of some boundary-value problems for the static theory of liquid crystals. Some related problems involving magnetic or electric fields are also discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01238933
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  • 9
    Electronic Resource
    Electronic Resource
    Homogenization of elliptic problems withL p boundary data (1987)
    Springer
    Applied mathematics & optimization 15 (1987), S. 93-107 
    Details
    ISSN: 1432-0606
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Abstract We consider the homogenization problem $$\begin{gathered} - \frac{\partial }{{\partial x_i }}\left( {a^{ij} \left( {\frac{x}{\varepsilon }} \right)\frac{{\partial u_\varepsilon }}{{\partial x_j }}} \right) = 0inD, \hfill \\ u_\varepsilon = gon\partial D, \hfill \\ \end{gathered} $$ whereD is a bounded domain,a is aC 1,α, periodic, uniformly positive matrix, and the datag belongs toL p (∂D), 1 〈p 〈 ∞. We show that, if∂D satisfies a uniform exterior sphere condition, thenu ε converges in L p (D) to the solution of the corresponding homogenized problem asε → 0. The proof is done via estimates for Poisson's kernel. We give examples showing that this convergence result does not hold for a generalG-convergent sequence of operators and depends on the periodicity ofa as well as on its smoothness.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01442648
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  • 10
    Electronic Resource
    Electronic Resource
    Counterexamples related to high-frequency oscillation of Poisson's kernel (1987)
    Springer
    Applied mathematics & optimization 15 (1987), S. 109-119 
    Details
    ISSN: 1432-0606
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mathematics
    Notes: Abstract Let $$L_\varepsilon = \frac{\partial }{{\partial x^i }}a^{ij} \left( {\frac{x}{\varepsilon }} \right)\frac{\partial }{{\partial x^j }},L_0 = q^{ij} \frac{{\partial ^2 }}{{\partial x_i \partial x_j }},$$ wherea is a smooth periodic matrix andL 0 is the homogenized operator corresponding to the family (L ε). LetD be a nice domain, and letP ε (x, y), P 0 (x, y) be the Poisson kernels associated withL ε andL 0. We show that in generalP ε (x, ·) does not converge strongly toP 0 (x, ·) inL p , by exhibiting two counterexamples. This result has the following implication in the theory of boundary control of distributed systems: if , withz given,u ε (x) = ∫ P ε (x, y)g(y) andu 0 (x) = ∫P 0 (x,y)g(y), then, in general, .
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01442649
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