Electronic Resource
New York, NY [u.a.]
:
Wiley-Blackwell
X-Ray Spectrometry
18 (1989), S. 119-129
ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
The x-ray fluorescence intensity of a sample contains the product of two angular-dependent factors: the first describes the angular dependence of the absorption of both incident and emitted radiation and the second is a geometrical factor accounting for the angular variation of irradiated and detected surface area. Theory for the angular dependence of x-ray intensities is presented. Good agreement is found with experimental data, measured with a novel focusing spectrometer using a small silicon detector. Measurement of the angular dependence of intensities is especially promising for the analysis of multi-layer samples.
Additional Material:
16 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300180309
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