ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new data acquisition and analysis system for scanning tunneling microscopy has been developed. With a single system, topography studies and current imaging tunneling spectroscopy can be performed, nanometer-scale indentations can be made, and the off-line analysis can be done. The system is based on the parallel use of several processors allowing for simultaneous data acquisition, processing, and display. User interfacing is done only via a host computer, a UNIX system with three-dimensional display capabilities, while the measurements and indentations are done via a second processor with optimal real-time characteristics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1141130
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