ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Atomic distribution functions for xZrO2·(1−x) SiO2 xerogels (x=0.3, 0.5) have been obtained by X-ray diffraction experiments. Three dimensional structure models that closely reproduce the experimental structural data have been constructed by reverse Monte Carlo simulations. The model results suggest that the investigated xerogels do not exhibit any characteristics of a phase segregation and have a homogeneous structure at the atomic scale. In particular, the local atomic ordering in 0.5ZrO2·0.5SiO2 xerogels heat treated to 770 K has been found to be similar to that in crystalline ZrSiO4. The question as to why a phase segregation occurs on the crystallization of xZrO2·(1−x)SiO2 xerogels (x−0.3, 0.5) has been addressed.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1023/A:1018686831719
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