ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
At the Erlangen tandem accelerator facility, a new Cs sputter ion source for accelerator mass spectrometry (AMS) has been developed and installed. Since cross talk between the different AMS samples in the ion source must be avoided, the sample magazine is stored in a separate vacuum chamber, which is opened to the source chamber only for exchanging the targets between the AMS measurements. To achieve large negative beam currents and a small beam emittance, a spherical shape of the Cs ionizer was chosen. The geometry of the ionizer, the target region, and the electrostatic lenses have been optimized by extensive ion optical computer simulations. A microcomputer system was developed, which controls the exchanging of the sputter targets, the high voltage supplies, the heating elements, the wobbling of the target, and which allows adjusting of the gap between ionizer and target. Behind the 90° injection magnet, the different isotopes are well separated, and the beam currents (e.g., 20 μA 12C−) are stable. For further optimization of the ion source parameters, an emittance measuring device has been constructed. The measured beam emittance is 2.5 π mm mrad MeV1/2.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1142914
Permalink